This website uses cookies to implement certain functions. If you use this website you agree to our Privacy Policy.
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.  


Register to our newsletter
Every two weeks -
all news at a glance

Latest Test and Measurement News

Corelis releases new Version of Boundary-Scan Tool Suite

24 April 2013 – Corelis announced the availability of version 7.8 of its ScanExpress Boundary-Scan Tool Suite. This new version includes numerous new features and enhancements including improved cluster testing support, intelligent BSDL file handling, and a new model-based test coverage. The new version also expands JTAG Embedded Test (JET) support to Texas Instruments AM335x Sitara processors.

Software improvements include:

  • A new model based test coverage which limits test vector generation to nets where all nodes have been identified with a device model.
  • Cluster definitions are now assignable by pin numbers in addition to the net name.
  • The ScanExpress TPG parsing engine will now automatically ignore leading “P” values found in pin definitions for non-BGA type BSDL files.
  • Floating network licenses are now supported under Linux.
  • JET support for Texas Instruments AM335x processors.

Current Corelis customers that have a valid maintenance contract can now access the new version 7.8 CD through the Corelis support website.

Related Articles:

No related articles found

Upcoming Events

Mobile World Congress 2020
Barcelona (Spain)
24 to 27 February 2020
- - - CANCELLED - - -
Embedded World 2020
Nuremberg (Germany)
25 to 27 February 2020
DATE 2020
Grenoble (France)
09 to 13 March 2020

Social Media