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Flexible High-Speed Test of Gigabit LAN and eSATA Interfaces

Goepel FXT X32HSIO418 March 2016 - GOEPEL electronic introduced new adapter cards for high-speed test of Gigabit LAN and eSATA interfaces. Thereby the test capabilities of the ChipVORX Module FXT-32/HSIO4 can be extended after PCIe 2.0, USB 3.0 and 1G LAN have already been covered. The Module FXT-32/HSIO4 enables electrical test at board level for laboratory and production applications.

The module is serially controlled and can be connected to any Test Access Port (TAP). The module is fully configurable with four slots for adapter cards. Thus, functional connectivity tests for Gigabit LAN interfaces and Bit Error Rate Tests (BERT) for eSATA interfaces can be executed.

The implementation of the connectivity tests is based on the use of the ChipVORX technology and enables validation of Gigabit LAN connections based on a protocol test. Thereby the Gigabit LAN connections with 10Mbit/s, 100Mbit/s and 1GBit/s are supported, both in half duplex mode and full duplex mode. With this new solution, interfaces of Gigabit LAN targets can be dynamically tested fully at the prototype stage.

BER tests enable qualitative validation of high-speed eSATA lanes based on BER eye diagrams. The eSATA lane is supported after eSATA Standard Gen 3. The new adapter enables static, at-speed and dynamic testing of eSATA interfaces.

FXT-X3/HSIO4 is a flexible external tool for various test requirements and provides distinct advantages compared to conventional functional test. The Boundary Scan software SYSTEM CASCON enables automatic test generation and test execution. As test functions, Bit Error Rate Tests (BERT) can be performed and static eye diagrams generated.

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