All-about-Test - Embedded JTAG Solution for SPEA Flying Probe Tester
This website uses cookies to implement certain functions. If you use this website you agree to our Privacy Policy.
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.  

Newsletter

Register to our newsletter
Every two weeks -
all news at a glance
captcha 

Latest Test and Measurement News

Embedded JTAG Solution for SPEA Flying Probe Tester

Spea 406007 April 2017 - GOEPEL electronic is extending support for embedded JTAG solutions technology for the SPEA4060 flying probe testers. As a result, analogue pin cards from the flying probe test system (FPT) can now also be used in digital boundary scan tests. The result is even higher test coverage. The flying probe test method can be used for flexible testing of discrete analogue components.

Combining this with GOEPEL electronic embedded JTAG solutions opens up a vast range of possibilities for enhanced, interactive testing. Previously, only digital resources from the SPEA4060 could be used for this in JTAG/boundary scan testing. Users who exclusively used analogue pin cards in the FPT system were therefore unable to benefit from the advantages of the two combined test technologies.

On account of the long-standing and close cooperation between SPEA and GÖPEL electronic, customers have a sophisticated and well-established package of hardware and software available to them, which can be perfectly integrated in the SPEA4060 flying probe testers. The more cost-effective analogue pin cards also offer potential customers an enormous price advantage when making use of system integration with GOEPEL electronic.

www.goepel.com/



Related Articles:

Upcoming Events

EMC Europe 2018
Amsterdam (NL)
27 to 30 August 2018
EPE '18 ECCE
Riga (Latvia)
17 to 21 September 2018
What's New in Electronics 2018
Birmingham (UK)
25 to 26 September 2018
Advertising
Advertising

Social Media

twitter_follow_420x50px