|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
Latest Test and Measurement NewsIn-System Emulation Technology for ARM11 Cores19 August 2010 - GOEPEL electronic has developed a dedicated model library for processors with ARM11 architecture that supports the emulation technology VarioTAP. The libraries are structured modularly as intelligent IP and enable a complete fusion of Boundary Scan test and JTAG emulation. Employing this technology, embedded or external Flash can be in-system programmed via the native processor function. Furthermore, VarioTAP supports interlaced Bus Emulation Tests (BET) and System Emulation Tests (SET) for extended JTAG/Boundary Scan functionality. “The new VarioTAP models supporting the ARM architecture are another important step towards the fast VarioTAP technology qualification for all ARM cores”, says Steffen Koehler, team manager Emulation Test in GOEPEL electronic’s JTAG/Boundary Scan Division. “In completed customer projects in telecommunication and multimedia, they enable a significant increase in fault coverage as well as Flash programming speed on a unique platform compared to hitherto utilised instrumentations.“ The VarioTAP IP-models for ARM11 will constantly be extended, and can be used for all implementations of these cores into respective MCU of chip providers. A multitude of possible configurations incl. multi-processor and multi-core applications are supported. The adaptive streaming technology of the TAP signals allows emulation tests to be carried out in parallel or interactively to Boundary Scan tests within a test program. In the flash programming both NOR and NAND flash are supported, whereas the so-called bad block handling can be realised in a standardised or customised version. The use of VarioTAP does not require expert background knowledge, additional development tools or processor-specific pods, which makes the handling easy and uncomplicated. Due to the OEM cooperation with all leading vendors of In-Circuit Testers (ICT), Manufacturing Defect Analysers (MDA), Flying Probe Testers (FPT) and Functionality Testers (FCT), the new solution is available for production with immediate effect. The new VarioTAP IP-models are supported beginning with SYSTEM CASCON version 4.5.3 and are activated by the licence manager like the system software. SYSTEM CASCON is a special JTAG/Boundary Scan development environment designed by GOEPEL electronic with currently 45 completely integrated ISP, test and debug tools. In regard to hardware, VarioTAP is supported by the controllers of the SCANBOOSTER series and the hardware platform SCANFLEX. www.goepel.com Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |