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Cooperation between GOEPEL electronic and IPextreme to Support IEEE 1149.7 (cJTAG)

21 September 2010 - GOEPEL electronic, a vendor of JTAG/Boundary Scan solutions compliant with IEEE Standard 1149.x and IPextreme, a supplier of high-quality IP (Intellectual Property) for System-on-Chip (SoC) Design, have verified new instrumentations for the recently adopted debug and test standard IEEE 1149.7 within the frame work of a long-term cooperation.

As a result, the total compatibility of GOEPEL electronic’s JTAG/Boundary Scan hardware platform SCANFLEX® with the IPextreme’s IEEE 1149.7 JTAG semiconductor has been assured.

“We see the IEEE Standard 1149.7 as one of the strategically most important test and debug standards of the future. Thanks to the excellent cooperation with IPextreme, a vendor of reference IP, we were able to quickly and effectively implement the respective support into our SCANFLEX® platform”, said Thomas Wenzel, Managing Director of the Boundary Scan division of the GOEPEL electronic GmbH. “Perspectively, this partnership is not only to guarantee a compatibility of IP and instrumentation hardware but to promote the industrial utilisation of IEEE 1149.7 as the access interface for embedded test and debugging of the next generation devices.”

“We are continuing our effort with our partners to enrich the ecosystem around the IEEE-1149.7 standard”, said Pierre-Xavier Thomas, VP of Engineering at IPextreme. “We are very pleased with our recent partnership with GOEPEL electronic, which allowed the validation of the compatibility of the latest release of GOEPEL electronic’s JTAG/Boundary Scan SCANFLEX® product with IEEE1149.7 protocol using the CJTAG IEEE 1149.7 semiconductor IP core available from IPextreme. We feel our effort with GOEPEL electronic will continue the momentum of IEEE1149.7 adoption and benefit IPextreme’s customers.”

“As Texas Instruments led the development of IEEE1149.7 and we are pleased to see the growing support on the tool side by vendors”, said Stephen Lau, product manager for emulation technology at Texas Instruments. “The emerging eco system of Instruments and IP's will help to expedite the adoption of IEEE1149.7 as the next generation test and debug standard in the industry.”

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