This website uses cookies to implement certain functions. If you use this website you agree to our Privacy Policy.
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.  

Newsletter

Register to our newsletter
Every two weeks -
all news at a glance
captcha 

Latest Test and Measurement News

NI-5632Vector Network Analyzer for Semiconductor and Mobile Device Test

16 November 2012 – National Instruments announced the NI PXIe-5632 VNA, optimized to help engineers meet increasingly complex RF test requirements at a fraction of the cost, size and time compared to traditional rack-and-stack solutions. The new PXIe VNA is built on an innovative dual-source architecture with frequency range covering 300 kHz to 8.5 GHz, independently tuned sources and source access loops to cover a diverse set of measurement applications.

The module integrates advanced VNA measurement capabilities to complete PXI-based test systems incorporating precision DC, high-speed analog and digital measurements, and more

“NI continues its strong investment in RF and microwave instrumentation expanding the adoption of PXI into high-end applications,” said Jin Bains, vice president of RF research and development at National Instruments. “The extensive feature set of the NI PXIe-5632 VNA significantly reduces the cost of network measurements, especially in high-volume automated test applications that require highly accurate measurements, a fast measurement speed and a small footprint.”

Product Features

• Two-port, 3-slot PXI Express VNA with frequency coverage from 300 kHz to 8.5 GHz

• Wide power range from -30dBm to +15dBm settable in 0.01dB steps for measuring compression and s-parameters of active devices

• Dual-source architecture with source access loops for pulsed S-parameter measurements and extended source power range.

• Frequency offset capability using independently tuned sources for measuring frequency translation devices and hot S-parameters

• Industry-leading programming interface for NI LabVIEW, ANSI C and .NET for simplified programming and fast test development times while maintaining RF measurement quality

• Price starts at €25,099

www.ni.com/vna


Related Articles:

No related articles found


Upcoming Events

Embedded World 2024
Nuremberg (Germany)
09 to 11 April
Control 2024
Stuttgart (Germany)
23 to 26 April
Automotive Testing Expo Europe 2024
Stuttgart (Germany)
04 to 06 June

  More events...
  See our Trade Show Calendar
  Click here

 

Advertising
Advertising