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Latest Test and Measurement NewsVector Network Analyzer for Semiconductor and Mobile Device Test16 November 2012 – National Instruments announced the NI PXIe-5632 VNA, optimized to help engineers meet increasingly complex RF test requirements at a fraction of the cost, size and time compared to traditional rack-and-stack solutions. The new PXIe VNA is built on an innovative dual-source architecture with frequency range covering 300 kHz to 8.5 GHz, independently tuned sources and source access loops to cover a diverse set of measurement applications. The module integrates advanced VNA measurement capabilities to complete PXI-based test systems incorporating precision DC, high-speed analog and digital measurements, and more “NI continues its strong investment in RF and microwave instrumentation expanding the adoption of PXI into high-end applications,” said Jin Bains, vice president of RF research and development at National Instruments. “The extensive feature set of the NI PXIe-5632 VNA significantly reduces the cost of network measurements, especially in high-volume automated test applications that require highly accurate measurements, a fast measurement speed and a small footprint.” Product Features • Two-port, 3-slot PXI Express VNA with frequency coverage from 300 kHz to 8.5 GHz • Wide power range from -30dBm to +15dBm settable in 0.01dB steps for measuring compression and s-parameters of active devices • Dual-source architecture with source access loops for pulsed S-parameter measurements and extended source power range. • Frequency offset capability using independently tuned sources for measuring frequency translation devices and hot S-parameters • Industry-leading programming interface for NI LabVIEW, ANSI C and .NET for simplified programming and fast test development times while maintaining RF measurement quality • Price starts at €25,099 www.ni.com/vnaRelated Articles: |
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