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Teradyne increases J750 Platform Throughput and Test Coverage

17 July 2012 - Teradyne announces the availability of the High Density Device Power Supply (HD DPS) instrument for the J750 and IP750 test platforms. The HD DPS instrument enables semiconductor companies to increase site count and DC measurement throughput resulting in lower cost of test for thousands of consumer digital devices including microcontroller, image sensor and standard logic devices. Teradyne has received multiple orders from multiple customers for the new HD DPS instrument and begun product shipments.

The HD DPS enables higher throughput by delivering more channels and higher throughput for DC measurements. Available in 24- and 48-channel instrument form factors to enable configuration flexibility, each DPS channel can provide up to 1A per channel and up to 24 channels can be merged to deliver 24A to the device under test to address higher current requirements typically encountered during production test for many emerging SOC devices.

"The HD DPS offers our diverse set of 150+ unique customers an easy path to upgrade over 3800 J750 systems in the field with more DPS channels to increase the site count and throughput to reduce the cost of production test,” said Kyle Klatka, Consumer Digital Marketing manager, Teradyne. "Teradyne continues to extend instrument performance and density for the J750 and IP750 systems to address emerging technical requirements while delivering best-in-class cost of test economics for consumer digital devices."

Since its introduction in 1998, Teradyne’s J750 and IP750 test systems have achieved broad market acceptance as a highly cost effective ATE delivering test coverage for the broadest set of diverse microcontroller, FPGA and digital audio/baseband devices with 3,800 system shipments to date. The J750 is widely available at more than 50 OSAT locations, and Teradyne offers a complete set of production interface solutions for wafer sort and final test.

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