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Advantest Adopts Galaxy Semiconductor Solutions for Test Data Analysis

27 October 2010 - Advantest Corporation and Galaxy Semiconductor Solutions announced that they have entered into a worldwide licensing agreement for Galaxy Examinator(TM), a software package for semiconductor test data analysis. Under the terms of the agreement, Advantest's engineering and applications teams will globally deploy Examinator for STDF format datalog validation, acceptance testing, device characterization and correlation.

Furthermore, in order to enable the most consistent data correlation and results, Advantest will promote the use of Examinator software to the users of its test equipment.

Examinator(TM) is a software solution that enables test and product engineers to perform device and test program characterization and yield analysis studies from standard semiconductor data files such as STDF. With just a single click Examinator generates comprehensive reports, such as: yield summary, Cp, Cpk, histograms, wafer maps, Pareto diagrams, and gage R/R. In addition, Examinator performs automatic guard-banding of test limits, and lets engineers perform "what-if" experiments to explore the impact of test program changes on yield and repeatability.

"Advantest's engineers work hand-in-hand with customers on the characterization of new devices and correlation of production test results to ensure higher product quality and yields while achieving the lowest cost of test," said Hirokazu Hagiwara, General Manager, 1st Software Division of Advantest. "We recognize the importance of giving our engineers the best tools in the industry to accomplish their goals, and we believe Galaxy's Examinator software offers Advantest the most competitive data analysis product on the market today."

"Advantest has been a Galaxy user for several years," said Bertrand Renaud, COO of Galaxy Semiconductor. "We are very pleased to extend our relationship with Advantest to a worldwide partnership, further reinforcing Examinator's position as the defacto industry standard for desktop test data analysis."

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