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aps Solutions is authorized Distributor of STAr Technologies Probe Cards in Europe

aps STAr Aries26 September 2017 - STAr Technologies, a manufacturer of Semiconductor test systems and probe cards based in Taiwan, named aps Solutions GmbH as authorized distributor for probe cards in Europe and Israel. STAr Technologies delivers cost-effective, high-density vertical probe cards with either buckling beam ("Cobra"), spring- or wire probes.

With its proprietary “Virgo” product line of probe cards, STAr designs and manufactures Parametric-, Reliability testing probe interfaces and “specialized Probe Cards” to meet extreme needs for high voltage/current/power, high/radio frequency, thermal management, etc. “Virgo” Probe Cards are available in standard and vertical contact technologies.

APS are pleased that they can now offer “turnkey” solutions to customers, which are in the field of Reliability testing, as APS are in the Analytical Prober equipment business as well.

The “Aries” series (for Wafer-Sort/ Chip Probing) of advanced vertical Probe Cards feature vertical contact technologies that offer excellent contact integrity, superb current carrying, life performance and the scalability to address the industry's most demanding pitch requirements. STAr’s “Aries-Gamma” advanced vertical Probe Cards enable unprecedented cost-performance to lower cost-of-test for high performance SOC ICs. “Aries-Gamma” latest offerings include direct-docking buckling beam type Probe Cards for all industry used ATEs.

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