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Readers Top 5 News of last 30 days
- 10 January 2019 - Advantest acquires Semiconductor System Level Test Business from Astronics Corporation
- 09 January 2019 - Signal Generators for testing Automotive eCall-Systems
- 11 January 2019 - Keysight launched new Service Model
- 08 January 2019 - Compact JTAG/Boundary Scan Desktop Test System
- 14 January 2019 - Testing DDR4 Memory on Prototypes and Production PCBs
Latest Test and Measurement News
Data Streaming and Visualization Service
24 January 2019 - Tektronix launched the new Initial State data streaming and visualization service for individuals. The cloud-based data service, which includes unlimited data streaming and beautiful visualizations, is priced at $9.99 per month or $99 per year and is free for students. Tektronix acquired Nashville, Tennessee-based Initial State Technologies Inc. earlier this year.
Predictive Maintenance for Inline AXI System
23 January 2019 - Goepel electronic launched a new app for the X Line · 3D X-ray system that provides the ability to create usage-based maintenance plans and monitor it independently ("Preventive/Predictive Maintenance"). Self-diagnosis with predictive and preventive maintenance management ensures stable machine conditions and repeatable, consistent performance.
Frequency Response Analysis with Oscilloscopes
22 January 2019 - Rohde & Schwarz has extended the application range of its R&S RTB2000, R&S RTM3000, and R&S RTA4000 oscilloscopes with a new option for frequency response analysis. Equipped with the R&S RTx-K36, the oscilloscopes can display Bode plots for both phase and gain against frequency simultaneously. With the new software option, users can analyze the response to frequency changes from 10 Hz up to 25 MHz without any additional piece of equipment and at a fraction of the price of dedicated solutions.
Highly Parallel Testing of Next-Generation Universal Flash Storage and PCIe BGA SSDs
21 January 2019 – Advantest unveiled its new T5851 STM16G memory tester for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
Motor Drive Analyzers with guided Test Setups and automated Measurements
18 January 2019 – The Fluke MDA 510 and MDA 550 Motor-Drive Analyzers save time and eliminate the hassle of setting up complex measurements, while simplifying the troubleshooting process for variable frequency drives. Simply select a test and the step-by-step guided measurements show where to make voltage and current connections, while the preset measurement profiles ensure you will capture all the data you need for each critical motor-drive section.
200/350MHz Oscilloscopes with deep Channel Memory
17 January 2019 - The new SIGLENT SDS2000X-E Series Super Phosphor Oscilloscopes offer a sampling at 2GSa/s with standard record length of 28Mpts/channel and a waveform capture rate of up to 400,000 frames/sec. The oscilloscopes are available in 200MHz and 350MHz bandwidths and support multiple powerful triggering modes that includes built-in serial bus triggering and decoding (I2C, SPI, UART, CAN, LIN).
Probe-2-Pad Inspection Station
16 January 2019 - aps Solutions developed a tool, that allows the user precisely to check the position of probe tips of a Probe Card versus the probe pads of a Semiconductor wafer. The tool allows to check the behavior of the probe tips under real touch-down conditions as well as investigation of probe tips or needle beams under a microscope.
More Articles ...
- Cable Tester supports 4-Wire Precision Resistance Measurement
- Testing DDR4 Memory on Prototypes and Production PCBs
- Keysight launched new Service Model
- Advantest acquires Semiconductor System Level Test Business from Astronics Corporation
- Signal Generators for testing Automotive eCall-Systems
- Compact JTAG/Boundary Scan Desktop Test System
- DisplayPort Verification Module with USB-C/eDP Support
- Test Automation Platform certified for Medical Software Engineering
- High Precision Dual-Channel DC Power Supply
- Direction-finding Antenna for locating Signal Sources
- Fast Production Test of UV-LEDs
- Stand-alone AOI System with 3D Camera Module
- Parametric Testing for Developing and Manufacturing Next-Generation ICs
- New Features and Functionality for NI LabVIEW NXG
- All-in-One 400GbE PAM4 BER Measurements
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