Jitter Analysis on Clock and Data Signals with Oscilloscopes

29 May 2013 — Rohde & Schwarz launches new options for its R&S RTO high-performance oscilloscope: the new R&S RTO-K12 jitter analysis option for automatic jitter measurements and the new R&S RTO-K13 option, a fully-integrated solution to perform realtime triggering and signal analysis based on the embedded clock.

In addition to automatic jitter measurements, the new R&S RTO-K12 jitter analysis option offers a wide range of intelligent functions. For example: A wizard-driven menu assists users with the most important measurements in order to obtain quick results. Configurable software clock data recovery (CDR) was implemented for the automatic time interval error (TIE) measurement function. The track function shows the progression of measured values and their time correlation with the trace, opening up additional analysis options. Geometric box elements help users quickly create mask tests.  

The new R&S RTO-K13 option's configurable hardware CDR is integrated into the oscilloscope's ASIC. This fully-integrated solution is the first to enable users to perform realtime triggering and signal analysis based on the embedded clock. Signal integrity on serial high-speed interfaces can be analyzed at a speed of up to 5 Gbps. Histograms and mask tests quickly return reliable results.  

The new R&S RTO-K12 jitter analysis and R&S RTO-K13 clock data recovery options are now available from Rohde & Schwarz.  

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