This website uses cookies to implement certain functions. If you use this website you agree to our Privacy Policy.
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.  

Newsletter

Register to our newsletter
Every two weeks -
all news at a glance
captcha 

Dual Head Robotic Prober

Huntron-access-probers18 November 2010 - The Huntron Access DH is a new dual head robotic prober that allows for true point-to-point measurements and is designed to be an open architecture platform. Adding custom probe heads to the Access DH is made possible by multiple interface connections (USB, Ethernet, etc...) available on each of the two heads.

The Huntron Access Prober is used to automate the testing of printed circuits assemblies (PCA) that would otherwise have to be tested by hand. Automating test procedures will significantly decrease test times therefore increasing productivity.

Access Probers are designed to accurately access test points on PCAs. The exceptional accuracy achieved by micro-stepping and linear encoding ensures reliable probing of the smallest surface mounted components. By using either the standard built-in test probe or a custom test probe, the Huntron Access Probers add flying probe technology to your new or existing equipment. The high-resolution color camera ensures correct probe placement and provides a clear view of the PCA under test.

Huntron Access Probers allow for economical, automated testing of densely packed surface-mount and other devices on the most complex boards from the smallest to the largest systems.

The precision robotic movement lets you probe points on the newest exotic chips, such as PLCCs, SOICs, PGAs, SSOPs, QFPs and others, without any expensive fixturing or programming required.

The Access DH Prober is a dual head Robotic Prober that is best suited for low volume PCA testing where interfacing between two points is necessary. The Access DH stands in it's own cabinet with plenty of space underneath for a rack mounted PC and other test instrumentation. The open architecture design of the Access DH makes it possible for you to utilize many different test technologies where automated probing of the PCA under test makes sense.



Upcoming Events

Embedded World 2024
Nuremberg (Germany)
09 to 11 April
Control 2024
Stuttgart (Germany)
23 to 26 April
Automotive Testing Expo Europe 2024
Stuttgart (Germany)
04 to 06 June

  More events...
  See our Trade Show Calendar
  Click here