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Latest Test and Measurement NewsNI enhances Test Management Software for Semiconductor Test22 March 2016 - National Instruments (NI) released the TestStand Semiconductor Module, which provides test system engineers with the software tools to quickly develop, deploy and maintain optimized semiconductor test systems. With the TestStand Semiconductor Module, engineers can now program lab characterization systems using the same programming paradigm they deploy on the factory floor with the Semiconductor Test System (STS), thus reducing the time required to correlate measurements. Digital Acquisition Card with up to 32 Channels and 720 MBit/s Data Rate21 March 2016 - The Spectrum M4i.77xx series of Digital Data Acquisition cards represent a major performance breakthrough for test engineers who require high-speed digital data logging with multi-channel logic analysis over extended time periods. Based on Spectrum's proven M4i series PCI Express (PCIe) platform the cards are small and compact. Each card comes equipped with 32 fully synchronous channels, large 4 GB on-board memory and a PCI Express x8 Gen 2 interface that offers outstanding data streaming performance. Flexible High-Speed Test of Gigabit LAN and eSATA Interfaces18 March 2016 - GOEPEL electronic introduced new adapter cards for high-speed test of Gigabit LAN and eSATA interfaces. Thereby the test capabilities of the ChipVORX Module FXT-32/HSIO4 can be extended after PCIe 2.0, USB 3.0 and 1G LAN have already been covered. The Module FXT-32/HSIO4 enables electrical test at board level for laboratory and production applications. Rohde & Schwarz launched 4 GHz Oscilloscope17 March 2016 - Rohde & Schwarz completed its oscilloscope portfolio with the R&S RTO2000, a compact lab oscilloscope for multi-domain applications. The R&S RTO2000 displays the correlations between time, frequency, protocol and logic analysis measurement results. Via the analog input channels, the user simultaneously sees the signal in the time and frequency domain, and if desired, the spectrogram. Newly added functions such as peak list, max. hold detectors and the logarithmic display make frequency analysis even more efficient. SAR Testing Solution for Wireless Devices16 March 2016 – Anritsu Corporation’s MT8820C Radio Communication Analyzer now integrates with both DASY6 and cSAR3D from Schmid & Partner Engineering AG (SPEAG) to provide seamless Specific Absorption Rate (SAR) compliance testing that significantly reduces assessment costs and maximizes flexibility. The measurement of RF exposure, expressed in terms of SAR, is a mandatory testing requirement in many countries, bringing with it a need for cost effective, accurate and reliable testing that reduces time to market. PXI Reference Solution for Military, Public Safety, Avionics Radio Communications16 March 2016 – Keysight Technologies announced a PXI open radio test reference solution and a radio test audio library for military and public safety radios. The Keysight Reference Solution enables engineers to quickly evaluate and integrate core radio test measurement capabilities into validation, production or depot test systems. mmWave Contactor for high Frequency Testing in high Volume Production15 March 2016 - Multitest introduced an innovative contacting solution for testing of extremely high frequency semiconductors in high volume production. The Multitest mmWave Contactor offers field proven outstanding electrical performance while maintaining best mechanical characteristics. The hybrid contacting solution combines traditional spring probe architecture for low frequency and power I/O’s while incorporating a cantilever solution for the peripheral high frequency transceiver I/O’s. More Articles ...
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