|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
Latest Test and Measurement NewsFlexible turnkey Antenna Production Test Solution25 March 2016 — By combining two of its innovative instruments, Rohde & Schwarz now offers manufacturing facilities a flexible solution that can test multiple antenna orientations simultaneously with high speed and measurement accuracy, repeatability and low energy consumption. The R&S TS7124 RF shielded box and the R&S CMW100 communications manufacturing test set can be configured to create customized radiation patterns and can be employed to test virtually any wireless communications technology. New Software Options for Precision SMU Series24 March 2016 – Keysight Technology introduced a number of different low- or no-cost software control options for its B2900A Series Precision Source/Measure Units (SMUs). The software options provide users access to a broad range of capabilities to support basic voltage and current sourcing up through full characterization of devices and materials using an intuitive graphical user interface. Oscilloscope Probes for Signals up to 20 GHz23 March 2016 – Tektronix introduced the P7700 series of TriMode probes for use with Tektronix performance oscilloscopes. Offering up to 20 GHz bandwidth, the new probes ease the challenges designers face when debugging circuits found in the latest mobile and enterprise designs by minimizing probe loading, improving access to smaller, more-densely packed test locations and lowering overall cost of ownership. NI enhances Test Management Software for Semiconductor Test22 March 2016 - National Instruments (NI) released the TestStand Semiconductor Module, which provides test system engineers with the software tools to quickly develop, deploy and maintain optimized semiconductor test systems. With the TestStand Semiconductor Module, engineers can now program lab characterization systems using the same programming paradigm they deploy on the factory floor with the Semiconductor Test System (STS), thus reducing the time required to correlate measurements. Digital Acquisition Card with up to 32 Channels and 720 MBit/s Data Rate21 March 2016 - The Spectrum M4i.77xx series of Digital Data Acquisition cards represent a major performance breakthrough for test engineers who require high-speed digital data logging with multi-channel logic analysis over extended time periods. Based on Spectrum's proven M4i series PCI Express (PCIe) platform the cards are small and compact. Each card comes equipped with 32 fully synchronous channels, large 4 GB on-board memory and a PCI Express x8 Gen 2 interface that offers outstanding data streaming performance. Flexible High-Speed Test of Gigabit LAN and eSATA Interfaces18 March 2016 - GOEPEL electronic introduced new adapter cards for high-speed test of Gigabit LAN and eSATA interfaces. Thereby the test capabilities of the ChipVORX Module FXT-32/HSIO4 can be extended after PCIe 2.0, USB 3.0 and 1G LAN have already been covered. The Module FXT-32/HSIO4 enables electrical test at board level for laboratory and production applications. Rohde & Schwarz launched 4 GHz Oscilloscope17 March 2016 - Rohde & Schwarz completed its oscilloscope portfolio with the R&S RTO2000, a compact lab oscilloscope for multi-domain applications. The R&S RTO2000 displays the correlations between time, frequency, protocol and logic analysis measurement results. Via the analog input channels, the user simultaneously sees the signal in the time and frequency domain, and if desired, the spectrogram. Newly added functions such as peak list, max. hold detectors and the logarithmic display make frequency analysis even more efficient. More Articles ...
Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |