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Latest Test and Measurement News50 GHz Handheld Combination Analyzer02 October 2015 – Keysight Technologies added six millimeter-wave models to its family of FieldFox handheld analyzers. The flagship model is the industry’s first handheld combination analyzer to provide coverage to 50 GHz. With more built-in capabilities than similar analyzers, FieldFox can replace three or four single-function instruments – benchtop or handheld – that are typically used for maintenance and troubleshooting of systems that operate at or above Ka-band frequencies. Tektronix expands Oscilloscope Family with new 50 GHz Model01 October 2015 - Tektronix announced the expansion of its DPO70000SX Performance Oscilloscope Series with 50 GHz and 23 GHz models. The new 50 GHz product is ideal for technologies such as 28 GBaud PAM4 and Kband frequency testing. The 23 GHz instrument joins the existing 33GHz models which feature compact dimensions and built-in scalability using the UltraSync synchronization technology. CPRI-based Solution makes RRH Field Testing Easier, Faster and More Cost-efficient01 October 2015 – Anritsu introduces a CPRI RF Measurement option for its BTS Master handheld base station analyzer family that can significantly reduce the operational expense associated with troubleshooting interference at base stations. The BTS Master-based CPRI RF measurement test set allows field engineers and technicians to conduct accurate RF measurements on Remote Radio Heads (RRHs) while remaining at ground level, eliminating the considerable expense and time associated with calling a tower crew to conduct interference measurements. Compact Power Supplies for Accurate, Reliable Bench Testing30 September 2015 – Keysight Technologies introduced a series of compact DC power supplies that offer LAN and USB interfaces and accurate, reliable power for testing and validating designs. The E36100 Series adds five new models with up to 100 V or 5 A output to Keysight’s extensive portfolio of bench power supplies. The E36100 Series’ compact form factor (2U, ¼-rack) saves space on the bench or in a rack, and standard LAN (LXI Core) and USB interfaces make it easy to connect the power supplies to a computer. Optical Spectrum Analyser for short-wavelength Infrared Signals29 September 2015 - The new Yokogawa AQ6375B optical spectrum analyser covers the short-wavelength infrared (SWIR) region with wavelengths from 1200 to 2400 nm. Based on the company's highly successful AQ6375 instrument, the new analyser combines high measurement performance with ease of operation, and incorporates a number of new features including a gas purging feature, a built-in cut-off filter, data-logging capabilities, a double-speed mode, and support for Windows file sharing. Keithley reduces Test Times for Parametric Test System by 25 Percent28 September 2015 – Tektronix released a major system software update (KTE version 5.6) for the Keithley S530 Parametric Test System that can reduce measurement speed by as much as 25 percent. This translates into increased wafer-level test throughput and directly improves the S530’s cost of ownership (COO) for semiconductor production and R&D departments. Pulse Modulation and Noise Figure Measurement up to 60 GHz25 September 2015 — With its R&S ZVA high end vector network analyzers and R&S ZVAX-TRM extension unit, Rohde & Schwarz offers an efficient and highly flexible solution for characterizing active components. Using a combination of a high-end R&S ZVA and the R&S ZVAX-TRM, users can now measure the noise figures of amplifiers, converters and transmit/receive (T/R) modules for radar and satellite applications. More Articles ...
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