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Complete Test of Fluorescent Lamps in less than 30 seconds18 September 2014 - The Fluke 1000FLT Fluorescent Light Tester eliminates the guesswork of maintaining fluorescent lamps by performing all the essential tests on lamps in less than 30 seconds: lamp tester, ballast tester, non-contact voltage detector, pin continuity tester, and ballast discriminator. The 1000FLT eliminates trial, error, and rework, and reduces the time maintenance teams spend fixing lights.
GW Instek launches new economical Safety Testers18 September 2014 - GW Instek launches new economical safety testers, the GPT-9600 Series, which offers an affordable solution for supporting routine tests of major items of the safety standards such as IEC, EN, UL, CSA, GB, JIS and other safety regulations. The GPT-9600 Series is built upon a platform of 100VA AC maximum power output. DDR4 BGA Interposers for Infiniium Series Oscilloscopes17 September 2014 - Keysight Technologiesintroduced DDR4 ball-grid array (BGA) probe interposer solutions for Infiniium Series oscilloscopes. Engineers can use the probes and oscilloscopes for debugging and characterizing DDR4 memory designs and testing device compliance with the JEDEC DDR4 standard. Rohde & Schwarz announces Manufacturing Test License agreement with Broadcom17 September 2014 - Rohde & Schwarz announced it has entered into a Manufacturing Test License (MTL) agreement with Broadcom Corporation. Through the MTL agreement, Rohde & Schwarz can provide certified verification test solutions to Broadcom WLAN and Bluetooth customers.
Optimized Test and Debug Tools for the latest Multicore SoCs16 September 2014 – In parallel to Freescale’s presentation of its latest Qorivva derivates, PLS Programmierbare Logik & Systeme now provides system developers with its Universal Debug Engine (UDE) for the multicore System-on-Chips (SoCs) MPC5746M, MPC5777M, MPC5748G, MPC5746C, MPC77xK and MPC574xP. PLS is one of the first tool suppliers to offer development tools specifically optimized for the features and functions of these multicore SoCs.
Polar Instruments showed next-generation Controlled Impedance Test System16 September 2014 - Polar Instruments previewed its next-generation CITS880s Controlled Impedance Test System (CITS) at PCB West 2014, 10 September in Santa Clara, California, USA. The CITS880s introduces Launch Point Extrapolation (LPE), enabling PCB fabricators to improve impedance control for the latest high-speed PCBs which use finer trace widths and thinner copper compared to conventional boards.
Nordson DAGE launches new Automated X-ray Inspection System15 September 2014 - Nordson DAGE launched its Xi3400 Automated X-ray Inspection System (AXI) during Nepcon South China held in Shenzhen 26th – 28th August 2014. This new Nordson DAGE AXI system offers complete inspection of solder joints and other critical hidden features found in electronic assemblies, PCBs and packaged semiconductors. Ideal for in-line or off-line operation, the Xi3400’s innovative algorithms enable fast and reliable automated inspection and real-time monitoring of critical process information. More Articles ...
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