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Latest Test and Measurement News
Dual Channel Function/Arbitrary Waveform Generators31 July 2014 - B&K Precision launched its new 4060 Series line of dual channel function/arbitrary waveform generators. The series includes three models that generate sine waveforms up to 80 MHz (4063), 120 MHz (4064), and 160 MHz (4065). Featuring an advanced pulse generator and high-performance 512k-point arbitrary waveform generator on one channel, these instruments are ideal for use in applications requiring high signal fidelity with extensive modulation and arbitrary waveform capabilities at a value price point.
Probes for high-accuracy on-wafer Measurement from 220 GHz to 1.1 THz31 July 2014 - Cascade Microtech launched the T-Wave series of waveguide probes for on-wafer probing of millimeter wave and sub-millimeter wave circuits. The new T-Wave probe series includes millimeter and sub-millimeter wavelength on-wafer ground-signal-ground probes and associated components for electrical measurement of devices and materials with frequencies up to 1.1 terahertz.
Illuminance Meter for 0.00 to 200,000 lux30 July 2014 - Hioki E.E. Corporation launched the Illuminance Meter FT3424. Illuminance meters are used to measure the brightness of light sources. Illuminance is defined by JIS and other standards, and the FT3424 complies with general classes AA and A as set forth in JIS C 1609-1:2006 and Class B devices under DIN 5032-7.
Inspection and Review Solutions for 16nm Node30 July 2014 - KLA-Tencor announced four new systems — the 2920 Series, Puma 9850, Surfscan SP5 and eDR 7110 — that provide advanced defect inspection and review capability for the development and production of 16nm and below IC devices. The 2920 Series broadband plasma patterned wafer, Puma 9850 laser scanning patterned wafer, and Surfscan SP5 unpatterned wafer defect inspection systems deliver enhanced sensitivity and significant throughput gains.
BroadR-Reach Interface Verification with Oscilloscopes29 July 2014 — Rohde & Schwarz has expanded the application field of the R&S RTO oscilloscopes to include the testing of automotive Ethernet interfaces. In line with the OPEN Alliance test specification, the new R&S RTO-K24 compliance test software enables users to perform automated tests on BroadR Reach Ethernet interfaces. BroadR Reach technology makes it possible to combine multiple applications such as video streaming from rear view cameras and signal transmission from automotive radar systems to create a single, open and scalable Ethernet network inside the vehicle.
MIPI M-PHY v3.0 Interface S-Parameter and Impedance Testing29 July 2014 – Agilent announced the availability of its Method of Implementation (MOI) document for the transmitter/receiver (Tx/Rx) interface S-parameter and impedance tests defined in version 3.0 of the MIPI Alliance Specification for M-PHY. The MOI, and a test package such as a state file, which makes setup and measurement easy, works with the ENA Series network analyzer’s enhanced time domain analysis option (E5071C-TDR).
Simple Import of AOI Test Programs28 July 2014 - The AOI systems of GOEPEL electronics now offer an import option for test programs of other system providers. The conversion shortens time for generation of test programs significantly compared to the use of CAD and pick & place data. More Articles ...
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