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Intelligent Breakout Boxes to Simplify NVH Testing04 July 2014 - VTI Instruments introduced its EMX-4008 and EMX-4016 - 8 and 16 channel breakout boxes (BOB's) for use with the EMX-425X series of modular dynamic signal analyzers. Incorporating these BOB's into a NVH test solution (Noise, Vibration, Harshness) provides users with an external trigger connector and an external calibration input connector to facilitate and simplify triggering and calibration of the EMX-425X cards. Corelis releases new Version of Boundary-Scan Tool Suite04 July 2014 – Corelis announced the availability of version 8.0 of its ScanExpress Boundary-Scan Tool Suite. This new version features significant improvements to the ScanExpress Debugger JTAG analyzer and toolkit, a new interface for managing ScanExpress TPG projects, plus numerous new features spanning all ScanExpress applications.
Hitex to become distributor for PLS’s Universal Debug Engine (UDE)03 July 2014 - Hitex Development Tools has signed with immediate effect a distribution agreement with PLS Programmierbare Logik & Systeme. This places Hitex as a key sales partner in the most important global territories for the Universal Debug Engine (UDE), PLS’s high-end debug and trace tool for 16 and 32 bit microcontrollers. UDE is a component-based development environment supporting well-known architectures such as Freescale’s Power Architecture and the Infineon AURIX, TriCore and XC2000/XE166 families.
Advantest introduces new Device Power Supply for T2000 Test Platform03 July 2014 – Advantest announced its new T2000 Enhanced Device Power Supply 150A (DPS150AE) module that enables its T2000 test platform to handle the load requirements for highly accurate testing of both high-current and low-voltage semiconductors, including microprocessor units (MPUs), application-specific ICs (ASICs) and field-programmable gate arrays (FPGAs).
Takaya introduces new Flying Probe Tester02 July 2014 - The APT-1400F of Takaya is the next generation Flying Probe Test System of Takaya, the inventor of flying-probe test technology. The new architecture provides average head-speed increases of up to 50% with throughput improvements of 30-50% over existing Takaya models. The completely upgraded XY stage of the APT-1400F, combined with the positioning accuracy from its enhanced optical system, provides a 25% improvement in probing accuracy over the APT-9411.
Relay and Substation Test System02 July 2014 - Megger introduces the SVERKER 900 as the engineer’s ultimate toolbox that addresses the increasing need for three-phase testing capability in electrical distribution substations, renewable power generation stations and industrial applications. The intuitive user interface is presented on the LCD touch screen. It has a powerful combination of current and voltage sources and a versatility of measurement possibilities.
Boston Semi Equipment acquires MVTS Technologies01 July 2014 – Boston Semi Equipment LLC (BSE) has completed the acquisition of MVTS Technologies (MVTS). BSE and MVTS are industry leaders in the market for reconfigured automated test equipment (ATE). The combination of the product lines, service offerings and global reach of both companies has created a single, comprehensive source for companies seeking ATE equipment solutions from the secondary market. More Articles ...
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