|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
Latest Test and Measurement News
Ultra-compact Vector Signal Generator for Production Tests03 June 2014 - Rohde & Schwarz presents its new R&S SGT100A, the smallest and fastest vector signal generator with up to 6 GHz, specially optimized for use in production test systems. Using its internal baseband generator, the instrument reliably produces test signals for various digital standards. The R&S SGT100A combined with the R&S FPS signal and spectrum analyzer yields the ideal solution for production tests of high-frequency components. Discontinuous Disturbance Measurements with EMI Receiver02 June 2014 – Agilent announced the addition of disturbance analyzer capabilities as a standard feature of its N9038A MXE EMI receiver. For those who need to make discontinuous-disturbance, or click, measurements, the MXE simplifies and automates data collection, analysis and report generation in accordance with CISPR standards 14-1 (emissions) and 16-1-1 (measurement apparatus and methods).
Ultra-low Jitter/Dual Clock Synthesizer02 June 2014 - Noise eXtended Technologies (Noise XT) introduced the 2 MHz to 7 GHz SLC Ultra-low Jitter/Dual Clock Synthesizer. The SLC is an affordable single or dual clock USB synthesizer with outstanding jitter in a small package. With a noise floor of -170 dBc/Hz at 10 MHz, the SLC has the lowest phase noise of any synthesizer in a compact, low cost package. The SLC measures just 85 x 110 x 200 mm.
Advantest introduces Measurement System for Testing Analog, Mixed-Signal and Sensor ICs30 May 2014 - Advantest Corporation released its new EVA100 measurement system, a value-added platform that combines digital and analog testing capabilities to handle small-pin-count analog, mixed-signal and sensor semiconductors. The EVA100’s expandable architecture provides the flexibility to conduct a wide range of measurement functions. Operation is highly intuitive, alleviating the need for users to have advanced programming skills and helping customers to get their latest ICs to market faster.
IPTE appoints representative in Italy30 May 2014 - IPTE, a supplier of production assembly and test automation in the electronics and mechanics assembly industry, is now working with GnG SMT as its new representative for Italy. Started from 2014 GnG SMT will supply sales services for IPTE in Italy. The cooperation covers the IPTE products for depaneling, marking, mounting and feeders.
Power Device Analyzer characterizes all Power Device Parameters29 May 2014 – Agilent introduced the industry’s first power device analyzer for circuit design. The Agilent B1506A is a single-box solution that automatically characterizes all power device parameters across a wide range of operating conditions and temperatures (-50 °C to +250 °C), at up to 1500 amps and 3 kV.
AOI System for bottom Side, top Side or simultaneous dual Side Inspection29 May 2014 - Mek (Marantz Electronics Ltd ) introduced several new additions to its line-up of AOI systems, including the new SpectorBOX “Bottom-Up” Modular system specially engineered for wave and selective solder THT and SMT manufacturing. The SpectorBOX which is designed to accommodate solder frames on return and/or feed conveyors. More Articles ...
Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |