|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
Latest Test and Measurement News
PXI Power Multiplexer for hot switching up to 10A at 30VDC24 March 2014 - Pickering Interfaces is expanding its range of PXI 10A multiplexers with the introduction of a new 10A power multiplexer. This new PXI 10A power multiplexer (model 40-661) is available in a variety of configurations ranging from 8 off 4:1 multiplexers to 1 off 32:1 multiplexer. Each multiplexer is capable of hot switching up to 10A at 30VDC and has a maximum DC hot switch rating of 125VDC. AC signals up to 250VAC at 10A can be switched. For cold switching applications the 40-661 is capable of withstanding 400VDC.
XJTAG Boundary Test Function for Agilent 3070 Board Tester21 March 2014 – XJTAG releases the XJLink2 3070. Approved by Agilent Technologies, it provides convenient, integrated access to XJTAG’s powerful test and programming tools from Agilent i3070 ICT machines. The combination of XJTAG’s advanced connection test and non-JTAG device testing/programming with the i3070’s measurement capabilities makes capturing defects easier than ever.
Cogiscan and Speedline Enter Strategic OEM Partnership21 March 2014 - Cogiscan and Speedline Technologies have entered an OEM relationship under which Cogiscan will provide software to harvest and report traceability data from Speedline printers. Under the agreement, the companies will develop a standard traceability package that Speedline will incorporate as part of its product portfolio and resell through its own channels.
Breakdown Testing at up to 10kV20 March 2014 - Keithley Instruments introduced two high voltage power supplies optimized for high voltage device and materials testing and high energy physics and materials science research. The Model 2290-5 5kV Power Supply and Model 2290-10 10kV Power Supply are well suited for high voltage breakdown testing of power semiconductor components. This includes devices made of current- and next-generation wide-bandgap materials like silicon carbide (SiC) and gallium nitride (GaN), designed for use in "green", energy-efficient power generation and transmission systems and hybrid and all-electric vehicles.
EMC Tests on Multimedia Devices in line with new CISPR 3520 March 2014 - The CISPR 35 EMC standard that prescribes future disturbance signal testing requirements for multimedia equipment is expected to be adopted this spring. The new CISPR 35 will combine the current test standards for devices and components in the IT (CISPR 24) and consumer electronics (CISPR 20) fields. Rohde & Schwarz, leading supplier of EMC T&M equipment, will release the R&S EMC32-K35 option for its R&S EMC32 EMC test software when the standard is adopted.
DMM/Multiplexer System featuring up to 320 Channels19 March 2014 - Rigol Technologies EU expands its product offering with a new data acquisition/data logger switch unit. The M300 combines a DMM with a gauge head selector switch. The highly versatile system can be extended with 5 plug-ins and optionally with a 6 1/2 digit DMM, 10 different switch and control modules of bipolar switches to matrix cards. For direct connection to a PC or notebook, all relevant interfaces such as LAN (LXI) USB, RS232 and GPIB are available.
PXI Source Measure Unit provides higher Speed, Density and Flexibility19 March 2014 - National Instruments announced the NI PXIe-4139 system source measure unit (SMU), a high-performance addition to the company’s SMU portfolio. This SMU can reduce overall cost of test and accelerate time to market for test engineers in a broad range of industries, from semiconductor to automotive and consumer electronics. The NI PXIe-4139 provides 100X faster sampling rate with at least twice the channel density of similar box instruments. More Articles ...
Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |