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Latest Test and Measurement News
Liquid-cooled high-power Broadband Amplifiers for EMC Test14 March 2014 - Rohde & Schwarz now offers up to 10 kW of power in a frequency range from 9 kHz to 225 MHz with its R&S BBL200 amplifier family. Thanks to a new liquid cooling system, these models are quieter and more compact than ever before. The high output power of the R&S BBL200 amplifier family makes these models ideal for EMS tests where high field strengths are required. They are particularly suitable for EMC tests in the automotive, aerospace and defense sectors in line with standards such as MIL STD 461F, DO 160F, ISO 11451, ISO 11452.
Model-based Tests directly on the Target Platform14 March 2014 – Tests directly on the target hardware with PikeTec‘s TPT model-based software tool are now possible as a result of coupling with the PLS (Programmierbare Logik & Systeme) Universal Debug Engine (UDE). The UDE provides the necessary functionality such as connection to the target system, FLASH programming, process control and reading and writing programme data etc. via the standard Component Object Model (COM) interface. Dual Mode SPI and AOI Inspection Platform13 March 2014 ― ASC International released the new LineMaster DM platform. The new system incorporates SPI and AOI into one platform for “Dual Mode” performance. The solid AOI/SPI platform validates the overall variables associated with component placement and solder paste printing. The system has undergone successful testing at numerous facilities and has been approved for release globally.
40 Gb/s High-Performance BERT for Datacom & Long Haul Testing13 March 2014 - Tektronix unveiled the industry's first fully integrated 40 Gb/s Programmable Pattern Generator (PPG). This 40 Gb/s PPG, along with the previously announced 40 Gb/s Programmable Error Detector now comprise a complete 40 Gb/s BERT solution. With 200 fs Random Jitter (RJ) and 8 ps risetime performance, the new Tektronix PPG4001 delivers the performance and signal quality critical for serial data testing at 40 Gb/s.
Advantest Introduces new Test Modules for Next-Generation RF-based ICs12 March 2014 - Advantest Corporation introduced two new test modules for high-speed, cost-efficient testing of radio-frequency (RF) ICs used in cell phones and wireless LAN devices built to meet 802.11ac and LTE-Advanced mobile communication standards. Both the 32-port WLS32-A module and the 16-port WLS16-A module are fully compatible with Advantest’s widely used T2000 platform.
Optical Spectrum Analyser for 600-1700 nm Wavelength Range12 March 2013 - The new Yokogawa AQ6370D benchtop optical spectrum analyser, the successor to the company’s best-selling AQ6370C, incorporates a number of new functions designed to enhance its accuracy and analysis capabilities in the 600-1700 nm wavelength range. Newly added functions include data logging, gate sampling, resolution calibration, an advanced marker function and an enhanced auto-sweep mode.
Protocol Analyzer with Support for SSIC, CSI-3 Interfaces11 March 2014 - Agilent Technologies introduced SSIC and CSI-3 support for its U4431A MIPI M-PHY protocol analyzer for next-generation mobile computing applications. This protocol analyzer support gives engineers in R&D and manufacturing deep insight into their MIPI M-PHY-based designs. CSI-3 (Camera Serial Interface) leverages the CSI-2 protocol of the D-PHY physical layer to the higher-performance M-PHY. SSIC (SuperSpeed USB Inter-Chip) allows USB-enabled functionality to work in M-PHY-based mobile systems. More Articles ...
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