|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
Latest Test and Measurement News
Free Software for Electronic Instrument Control and Test Automation06 March 2014 – Agilent Technologies released the newest version of its Command Expert software for faster and easier instrument control in many test application development environments. This release includes support for Python, a common development environment for engineers. It also includes updates to the newest versions of the other development environments, along with continuing software enhancements.
Ultracompact Drive Test Scanner for wireless Networks05. March 2014 - At Mobile World Congress 2014 Rohde & Schwarz presented the R&S TSME – a new, ultracompact drive test scanner for today's and tomorrow’s wireless communications standards and frequency bands. Measuring 151 mm x 47 mm x 93 mm and weighing just 650 g, it is not only much smaller and lighter than competing devices, it also consumes very little power, making it the ideal solution for testing the quality of communications channels in the field as well as inside buildings where high data traffic presents a difficult set of problems.
XJTAG enters Repair Market with major new Release05 March 2014 – XJTAG introduced version 3.2 of its boundary scan development system. This major new release extends the concept of boundary scan testing to allow engineers to test boards where they do not have access to a netlist. The flagship feature of XJTAG’s version 3.2 release, the ‘no netlist’ feature allows users to create projects within XJDeveloper for boards without netlists, using just BDSL files for the JTAG devices.
Tektronix announces Pricing and Line-up Changes for Mixed Signal Oscilloscopes04 March 2014 – Tektronix announced that its MDO4000B Series of Mixed Domain Oscilloscopes are now available at the same price point as MSO4000B Mixed Signal Oscilloscopes. The Tektronix Mixed Domain Oscilloscopes (MDO) include a built-in spectrum analyzer along with 4 analog channels and 16 digital signal inputs — with the MDO4000B Series enabling engineers to capture synchronized analog, digital and RF signals for a complete, time-correlated system view, saving debug time.
Anritsu demonstrates LTE-A Category 6 Peak Data Rates of 300 Mbps04 March 2014 – Anritsu demonstrated with Qualcomm Technologies a Category 6 LTE device and network simulator using 20+20 MHz Carrier Aggregation (CA). The two companies have jointly performed tests with a device based on the new Qualcomm Gobi 9x35 modem, the world’s first LTE Advanced World Mode Category 6 chipset solution. Both the Gobi 9x35 and Anritsu MD8430A LTE simulator support CA with two LTE FDD or TDD component carriers (CCs), each with a bandwidth of up to 20 MHz, allowing Category 6 peak data rates of 300 Mb/s in the downlink.
80 and 120 MHz Waveform Generators with low Jitter and Distortion03 March 2014 – Agilent Technologies introduced the 33600A Series waveform generators with exclusive Trueform signal-generation technology. With Trueform, the instruments are able to deliver unmatched capabilities used to generate a full range of signals for even the most demanding measurements required by engineers and technicians during electronic device design and manufacturing test.
Rigol extends Mixed-Signal Digital Oscilloscope Family03 March 2014 - RIGOL Technologies presents a mixed signal extension to the DS1000Z and DS2000A Digital Oscilloscopes series. The oscilloscopes offer a bandwidth from 70MHz to 300MHz and a specially designed analog front end with a lower noise floor and a wider vertical range (MSO2000A only 500 uV/div to 10 V/div) at full bandwidth. The instruments also leverage Rigol’s innovative "UltraVision" technologies from the DS6000 series. More Articles ...
Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |