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Latest Test and Measurement NewsTektronix acquires Picosecond Pulse Labs21 January 2014 - Tektronix announced the acquisition of Picosecond Pulse Labs. The move is intended to strengthen the Tektronix portfolio in the growing market for test equipment to support 100G/400G optical data communications research and development. The terms of the transaction were not disclosed. World's first Signal and Spectrum Analyzer with 500 MHz Analysis Bandwidth21 January 2014 - Rohde & Schwarz has once again expanded the analysis bandwidth for its R&S FSW high-end signal and spectrum analyzers. In the past, 320 MHz was considered an excellent value. Rohde & Schwarz is the first company to offer analysis bandwidth of 500 MHz. The new R&S FSW-B500 hardware option is now available for all analyzers of the R&S FSW family and can therefore be used for measurements in a frequency range up to 67 GHz. 64-Channel General Purpose Module for Testing of Power Management ICs20 January 2014 - Advantest Corporation introduced a new 64-channel, general purpose voltage-current (VI) module for its production-proven T2000 test platform, offering the industry’s lowest cost of test for parametric testing of high-pin-count ICs used in power-management and automotive applications. 3D X-Ray Inspection System with additional optical Inspection20 January 2014 - GOEPEL electronic enhanced its 3D X-ray inspection system OptiCon X-Line 3D with numerous new functionalities. By integration of a module for Automated Optical Inspection (AOI), the system represents the world’s first so called “AXOI combinational system”. The term means that the OptiCon X-Line 3D system primarily inspects assemblies with x-ray, and only the inspection tasks impossible to execute with AXI are taken over by the integrated AOI module. Pico Technology joins the MathWorks Connections Program17 January 2014 - Pico Technology announced that it has become a member of the MathWorks Connections Program. The PicoScope 3000 Series oscilloscopes now have an instrument driver for the Instrument Control Toolbox. This includes all models apart from the Mixed Signal and Differential Oscilloscopes, with drivers for other product ranges to be provided in the future. Keithley enhances S530 Parametric Test System Capabilities17 January 2014 - Keithley Instruments introduced the latest upgrades to its S530 Parametric Test Systems. This includes the new S530 Diagnostics and System Verification Tool. This new GUI-driven tool expands diagnostic coverage for all system instrumentation and matrix pathways, providing greater confidence in the health of the system. The upgrade includes a variety of new measurement capabilities and added flexibility to the Keithley Test Environment (KTE). HDMI 2.0 Compliance Test Software for Transmitters and Receivers16 January 2014 – Agilent Technologies introduced two compliance test software packages for physical-layer testing of devices that use the new High-Definition Multimedia Interface (HDMI) 2.0 specification. The transmitter compliance test software allows engineers to use Agilent Infiniium oscilloscopes to test their HDMI 2.0 transmitters. Agilent’s receiver compliance software can be used with the company’s transition-minimized differential-signaling signal generator platform and the Agilent M8190A arbitrary waveform generator to test HDMI 2.0 receivers. More Articles ...
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