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Readers Top 5 News of last 30 days
Latest Test and Measurement NewsNetwork Analyzer Option for high precision S-Parameter Measurements13 December2013 – Agilent introduced a metrology option for its PNA family of network analyzers that offers national metrology institutes and calibration laboratories around the world the ultimate in S-parameter measurement accuracy. Stability and measurement accuracy are key characteristics metrology laboratories look for in a network analyzer. Most solution providers, however, fail to characterize the thermal stability of their instruments. Signal and Spectrum Analyzers to support IEEE 802.11p Vehicle-to-Vehicle Communications12 December 2013 — Rohde & Schwarz has expanded the functionality of its R&S FSV and R&S FSW signal and spectrum analyzers to also support the IEEE 802.11p wireless standard. The new R&S FSV-K91p and R&S FSW-K91p measurement options are especially designed for IEEE 802.11p compliant signal analysis in vehicle-to-vehicle (V2V) applications and intelligent transport systems (ITS). High-Performance Test Handler for SoC Devices12 December 2013 - Advantest launched its newest test handler for system-on-chip (SoC) devices, the field-upgradable M4871 pick-and-place system. The handler integrates Advantest’s proven technology from the company’s existing product lines with advanced, new functions including visual alignment with high throughput, active thermal control using Advantest’s Tri-Temp capability and a new handler data visualization framework that enables users to conduct real-time monitoring of a test cell’s production status from any network-enabled connection. Parallel Test and Programming in Gang Applications11 December 2013 - GOEPEL electronic has extended its SCANFLEX Boundary Scan hardware product range, now introducing the SFX Gang Test Module Kit as a new solution for parallel test and programming of up to 32 different assemblies with an integrated Mass Interconnect Interface from Virginia Panel. The kit, consisting of three basic modules, is an easy-to-integrate complete solution for parallel applications based on Embedded System Access (ESA) technologies providing throughput increase by factors of 16 or 32. Anritsu enhances BERT Signal Quality Analyser11 December 2013 – Anritsu introduced a high-sensitivity error detector and other additions to its MP1800A BERT (Bit Error Rate Tester) signal quality analyser to support multi-channel BER measurements up to 32.1Gbit/s. The enhanced MP1800A is suitable for testing the backplanes, cables, and interconnects used in the next generation of ultra-high speed network equipment. Background: Digital Debugging - better using a Mixed-Signal-Oscilloscope or a Logic Analyser?
10 December 2013 - Today’s technology is fundamentally balanced on an increasingly fine line between the analogue and digital domains; as data speeds increase — both within and between devices — the ‘ideal world’ of fast, clean digital transitions becomes evermore difficult to achieve. This presents new and escalating challenges when verifying faster digital signals that exhibit more and more analogue-like features. As a result it is becoming necessary to remove the hard line between digital and analogue. Teledyne LeCroy adds Mixed Signal Capabilities to HDO Oscilloscopes09 December 2013 - Teledyne LeCroy introduces the HDO4000-MS and HDO6000-MS high definition oscilloscopes which combine 16 channels of flexible mixed signal capabilities with HD4096 high definition technology, long memory, and a compact form factor, in bandwidths from 200 MHz to 1 GHz. All HDO models sport a large 12.1" touch-screen display and intuitive interface to enhance operation. More Articles ...
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