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Latest Test and Measurement NewsInnovative Wafer Inspection combining 2D and 3D Measurements02 December 2013 - Since the density and complexity of wafer structures increase every year, the industry needs high-performing and reliable systems for quality control. Against this background, ISRA VISION introduces a product line offering an innovative technological approach for non-contact optical wafer inspection. As required, different 2D and 3D gauging procedures may be combined into one inspection system measuring structure sizes of down to 1 micrometer in under one minute. iSYSTEM introduces Wireless Debugger29 November 2013 – iSYSTEM introduced industry's first truly wireless debugger. The iONE-BT allows the wireless communication between a target application and a PC running iSYSTEM's winIDEA/testIDEA debugging and test software, via Bluetooth. The iONE-BT consists of two modules: A debug module which attaches to the target via standard connections (ie, JTAG) and which contains a Bluetooth antenna and a Bluetooth dongle which attaches to the host PC by USB. Switch Matrix for Vector Network Analysis with up to 48 Ports28 November 2013 — Rohde & Schwarz introduces the R&S ZN-Z84, an external switch matrix designed to complement the R&S ZNB network analyzer. The matrix covers the frequency range from 10 MHz to 8.5 GHz, and the base model is equipped with six test ports. When needed, the number of test ports can be increased in groups of six to provide a total of 24 ports. A four-port R&S ZNB with two 24-port matrices can therefore support 48 test ports. N4L appointed distributor for Bulgaria, Greece, Romania and Serbia27 November 2013 - N4L, a manufacturer of test and measurement instruments for power electronics based in UK, announced that Neurotex Ltd have been appointed as official distributors for Bulgaria, Greece, Romania and Serbia for all N4L equipment following the delivery of formal training to Neurotex staff at Newtons4th head office in the UK. Advantest launches Photo Mask Measurement Tool27 November 2013 - Advantest Corporation launched its new E3640 MVM-SEM (Multi Vision Metrology Scanning Electron Microscope) tool for measurement of patterns on photomasks and other media ad dimensions as small as 1Xnm. A new entry in Advantest’s widely-adopted E3600 Series of SEM systems, the E3640 delivers significantly improved measurement accuracy and higher throughput. Its industry-best pattern measurement capability supports the coming shift to the 1Xnm node for semiconductor volume production. USB Plug and Play comes to the NI LabVIEW RIO Architecture26 November 2013 – National Instruments announced four new R Series boards (USB-7855R, USB-7856R, USB-7855R OEM and USB-7856R OEM) with USB connectivity, which help engineers add FPGA technology to any PC-based system using one of the most widely adopted buses on the market. These products, based on the LabVIEW RIO architecture, are a result of the company’s continued investment in the R Series product family. Compliance Testing Application for SFP+ and QSFP+ Ethernet Standards25 November 2013 – Agilent Technologies introduced a compliance testing application for devices that use SFP+ (enhanced small form-factor pluggable) standards in networking and server applications. Agilent’s solution for transmitter tests includes SFP+ and optional QSFP+ (quad-enhanced small form-factor pluggable) test standards as described in the SFF-8431 specification. The N6468A SFP+ Ethernet compliance application can be used with all currently shipping Infiniium real-time oscilloscopes that have bandwidths of 25 GHz or more. More Articles ...
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