|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
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Latest Test and Measurement News
High Speed Flying Probe PCB Test System
13 February 2017 - atg Luther & Maelzer will introduce its new A8a Automatic Bare Board Flying Probe Test System at IPC APEX EXPO 2017, which is scheduled to take place on February 14 – February 16, 2017 at the Convention Center in San Diego CA. To achieve high throughput the key features of the A8a is a new design dual shuttle system which reduces the product exchange time to zero seconds.
NI upgrades Performance of VirtualBench All-in-One Instrument
10 February 2017 - National Instruments (NI) announced the VB-8054 instrument, a new higher performance model of VirtualBench. VirtualBench plays a key role in reducing the cost and footprint of test and measurement systems by consolidating five of the most commonly used instruments into one device without compromising the performance of each instrument. Combined with a modern software experience and simple programming interface, VirtualBench creates new efficiencies for engineers interacting with benchtop test equipment or developing low-cost automated test systems.
Testing OIF and IEEE PAM4 Interface Standards
09 February 2017 – Teledyne LeCroy announced the addition of fully automated transmitter testing for 56-Gb/s, PAM4-based interfaces. The new QPHY-56G-PAM4 option adds standards-specific measurement capabilities to a measurement portfolio that already includes the PAM4 signal analysis capabilities pioneered by Teledyne LeCroy in recent years.
Oscilloscope Probe with large Offset Range and a DC Voltmeter
08 February 2017 - The R&S RT-ZPR20 of Rohde & Schwarz is a new, extremely low-noise power rail probe with a bandwidth of 2 GHz. Its 1:1 attenuation also ensures very good sensitivity. The large offset range of ± 60 V permits analysis of the smallest disturbance signals during power integrity measurements, even on DC power supplies with a high voltage level. The probe also features an integrated high-precision DC voltmeter.
32 Gb/s Protocol-Aware Bit Error Rate Tester
07 February 2017 - Tektronix introduced the industry's first 32 Gb/s protocol-aware bit error rate test and analysis system. The new Tektronix BSX series BERTScope not only helps characterize the receiver in Gen3 and Gen4 devices – it enables users to shorten the time needed to debug link training and bit error rate issues.
First approved Test System for new CTIA MIMO Over-the-Air Standard
06 February 2017 - CTIA included ETS-Lindgren in the MIMO Authorized Equipment List as the first and only supplier that is able to provide a system level solution to conduct MIMO Over-the-Air measurements in accordance with the CTIA Test Plan for 2x2 Downlink MIMO and Transmit Diversity Over-the-Air Performance, Version 1.1. The list includes ETS-Lindgren’s Antenna Measurement System (AMS) Model AMS-8700 as well as the AMS-8900 Model Series.
B&K Precision refreshes Function / Arbitrary Waveform Generator Line
03 February 2017 - B&K Precision announced the launch of its 4050B Series dual-channel function/arbitrary waveform generators, and replaces its former models 4053, 4054, and 4055 with enhanced specs and functions. The new design improves every aspect of the instrument, offering better square wave performance and many other features at no additional cost. The 4050B Series can generate waveforms up to 60 MHz for use in applications requiring stable and precise sine, square, triangle, and pulse waveforms, modulation and arbitrary waveform capabilities.
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Oscilloscope JTAG Boundary Scan Goepel PXI Rohde & Schwarz Tektronix Keysight AOI Anritsu National Instruments Inspection LTE Aeroflex Teledyne LeCroy Yokogawa In-Circuit-Test Keithley AXI Spectrum Analyzer Signal Analyzer Automotive EMC-Test Advantest Multitest B&K Precision Signal Generator Corelis Flying Prober Cognex SPI Teseq Power Supply GAO Tek Pickering Fluke Teradyne Switching Viscom PCIe
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