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News - Board and System TestUltra-compact JTAG/Boundary Scan Controller for Lab and Production13 July 2022 - With the PicoTAP ATE, the JTAG/Boundary Scan Controller PicoTAP has been further developed for use in the simple performance range. With additional hardware elements, the flexibly configurable compact unit supports a variety of so-called embedded access technologies. These test and validation methodologies use instruments embedded in the design to test and programme complex boards with greatly reduced physical access. The PicoTAP ATE was developed as a compact device primarily for stand-alone use in the laboratory and in production. Its ultra-compact design makes it ideal for integration into various test systems. FR1 FR2 Dual Connectivity Test Cases06 July 2022 – Anritsu Corporation announced that the Global Certification forum's (GFC) Certification Agreement Group (CAG) has approved the industry first Dual Connectivity Protocol Conformance test for Standalone (SA) 5G New Radio (NR) on the ME7834NR Protocol Test Platform. NR Dual Connectivity (NR DC) allows a device to connect to two 5G NR serving nodes concurrently enabling higher throughput, better coverage, and improved latency and reliability. This is the first test where NR SA is operated over millimeter Wave (mmWave), and sub-6GHz frequencies simultaneously. 5G devices can now take advantage of the wider reach of mid-band sub-6 GHz frequencies along with the high data rates supported by mmWave. Double-sided 3D Inspection of THT Assemblies30 June 2022 - GOEPEL electronic enhanced its system THT Line · 3D, an AOI for double-sided, parallel inspection in electronics production. The system now features an increased inspection depth and inspection reliability. The THT Line · 3D can now also inspect both the top and bottom of the assembly simultaneously in 3D. An additional 3D AOI module in the system makes this possible. As a result, it is possible, for example, to inspect selective solder joints on both sides of the assembly at the same time and to measure the solder volume and the pin length with the 3D method. PCI Express 5.0 OCP NIC 3.0 Interposer29 June 2022 – Teledyne LeCroy announced availability of a PCI Express 5.0 Open Compute Project (OCP) Network Interface Card (NIC) 3.0 interposer that works in combination with Teledyne LeCroy’s Summit family of PCI Express 5.0 protocol analyzers. The new OCP interposer allows engineers to test product designs that incorporate OCP NIC 3.0 with PCIe 5.0, NVM Express (NVMe) or Compute Express Link (CXL) technologies. The PCIe 5.0 OCP interposer joins the list of CrossSync PHY enabled interposers, allowing users to debug enhanced power management and link training equalization through correlated and time aligned physical and protocol layer views. Simplified Verification and Debugging of CAN XL and other Automotive Protocols28 June 2022 - Keysight Technologies released an oscilloscope-based automotive protocol trigger/decode solution (D9010AUTP) covering CAN XL (Controller Area Network eXtra Long) that enables engineers to verify and debug low-speed automotive serial bus protocols and simplify the development and troubleshooting of systems including CAN/CAN FD (Flexible Data Rate) and CAN XL. eSIM Test Profile Download Service for 5G and 4G Protocol Testing22 June 2022 – Anritsu Corporation and Comprion announced the availability of downloadable 5G and 4G eSIM test profiles for use with Anritsu’s MT8000A Radio Communications Test Station and Rapid Test Designer (RTD) application software. An increasing number of mobile device manufacturers are integrating embedded SIMs (eSIMs) into their products, whether phones, tablets, wearables or IoT devices, both for flexibility and to save valuable physical device real-estate. However, because eSIMs are non-removable, it is now more difficult to set-up communication testing between the mobile device and a network simulator in the lab. PCIe Integrity and Data Encryption (IDE) Protocol Testing Solution20 June 2022 – Teledyne LeCroy presents new protocol analysis and traffic generation solutions for testing PCI Express (PCIe) Integrity and Data Encryption (IDE) security protocols using their Summit Protocol Analyzers and Exercisers. The Summit PCIe analyzers are now capable of providing graphical representations of IDE packets, encrypted/decrypted payloads, and protocol errors to ensure conformance to the specification early during the design phase, and offer a means to identify and thwart security attacks. More Articles ...
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