|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
News - Board and System TestCapturing Functional Compliance Violations on DDR and LPDDR Memories31 August 2015 – Keysight Technologiesintroduced a new software package for use with Keysight logic analyzers, the B4661A memory analysis software. The software offers the industry’s only functional-level compliance violation testing capability across DDR4 and LPDDR4 speed changes. The new B4661A memory analysis software has a performance analysis option that provides powerful new trace overview and navigation features. Integrated Fader for LTE-Advanced 4x4 MIMO and 8x2 MIMO Tests26 August 2015 – Anritsu has integrated channel fading simulation into its 4G LTE-Advanced Signalling Tester, the MD8430A. The new digital baseband fading options convert the MD8430A into a full-featured fading simulator supporting industry standard 3GPP-defined fading profiles. The MD8430A fading options can be combined with the MD8430A, cutting the need for investment in additional hardware to perform signalling tests under realistic radio frequency (RF) conditions. Economical Line Impedance Stabilization Network for Pre-compliance Testing25 August 2015 - Saelig Company announces the availability of the TBLC08 Line Impedance Stabilization Network (LISN) which enables measurements of line-conducted interference within the range of 9kHz to 30MHz, according to the CISPR16 or other standards, before any formal testing commences. The TBLC08 is designed especially for pre-compliance testing of single phase, AC-powered equipment with supply voltages up to maximum 260V. Fast Production Tests for GNSS Solutions20 August 2015 -- Rohde & Schwarz offers a new, speed-optimized production tester - the R&S SMBV100A vector signal generator equipped with the R&S SMBV-P101 package. The fast GNSS production tester supports the GPS, Glonass, BeiDou and Galileo satellite systems and includes a wealth of additional test functions for characterizing GNSS chipsets and modules. During production testing of modules and receivers for satellite-based communications, the basic GNSS signal reception and the connection between the antenna and GNSS chipset need to be checked. PXI-based Wireless Test System optimized for Throughput in Production14 August 2015 - National Instruments (NI) released the Wireless Test System (WTS), a solution that is aimed to lower the cost of high-volume wireless manufacturing test. The WTS combines the latest advances in PXI hardware to offer a single platform for multi-standard, multi-DUT and multi-port testing. When used with flexible test sequencing software, such as the TestStand Wireless Test Module, manufacturers can significantly improve instrument utilization when testing multiple devices in parallel. Ethernet and Fibre Channel Protocol Analysis12 August 2015 – Teledyne LeCroy released the Net Protocol Suite version 1.80 for the SierraNet and SierraFC family of Ethernet and Fibre Channel protocol analysis and traffic modification and impairment tools. The SierraNet and SierraFC family of protocol analysis test tools are the defining platforms for pin-point determination of events and issues affecting high-speed storage and fabric interconnections, during the design and validation phase as well as in the datacenter. 5G Channel Sounding Reference Solution11 August 2015 – Keysight Technologies affirmed its technology leadership in 5G wireless research with the introduction of the 5G channel sounding Reference Solution. The new Reference Solution is designed for accelerating advanced research of millimeter-wave 5G channel models and includes ultra-broadband and MIMO, key requirements to measure the millimeter-wave channel and validate new air interface standards. More Articles ...
Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |