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Readers Top 5 News of last 30 days
News - Board and System TestSignal Testing Solution for European and Russian Emergency Road Assistance Systems07 September 2015 – Anritsu Corporation has released new functionality for the MD8475A to provide the first laboratory hardware in the loop system level test for the European eCall system and Russian ERA/GLONASS system. The newly developed eCall Tester option (MX703330E) and MSD ERA/GLONASS option (MX703330E-031) used in combination with the MD8475A now supports in-house testing and evaluation of communications modules (in-vehicle systems, IVS) with built-in eCall and ERA/GLONASS functions, as well as general evaluation following installation of these modules in automobiles. At-speed in-system Programming of Flash Memory using IJTAG04 September 2015 – Programming memory in-system, or after the devices have been soldered to a circuit board, is the most efficient method, but the challenge for design and manufacturing engineers has always been the slow speeds of the process. Now, enhancements to ASSET InterTech’s ScanWorks platform for embedded instruments can speed up in-system programming by a factor of 1,000, reducing programming times from 10 or more minutes to one or two seconds. Capturing Functional Compliance Violations on DDR and LPDDR Memories31 August 2015 – Keysight Technologiesintroduced a new software package for use with Keysight logic analyzers, the B4661A memory analysis software. The software offers the industry’s only functional-level compliance violation testing capability across DDR4 and LPDDR4 speed changes. The new B4661A memory analysis software has a performance analysis option that provides powerful new trace overview and navigation features. Integrated Fader for LTE-Advanced 4x4 MIMO and 8x2 MIMO Tests26 August 2015 – Anritsu has integrated channel fading simulation into its 4G LTE-Advanced Signalling Tester, the MD8430A. The new digital baseband fading options convert the MD8430A into a full-featured fading simulator supporting industry standard 3GPP-defined fading profiles. The MD8430A fading options can be combined with the MD8430A, cutting the need for investment in additional hardware to perform signalling tests under realistic radio frequency (RF) conditions. Economical Line Impedance Stabilization Network for Pre-compliance Testing25 August 2015 - Saelig Company announces the availability of the TBLC08 Line Impedance Stabilization Network (LISN) which enables measurements of line-conducted interference within the range of 9kHz to 30MHz, according to the CISPR16 or other standards, before any formal testing commences. The TBLC08 is designed especially for pre-compliance testing of single phase, AC-powered equipment with supply voltages up to maximum 260V. Fast Production Tests for GNSS Solutions20 August 2015 -- Rohde & Schwarz offers a new, speed-optimized production tester - the R&S SMBV100A vector signal generator equipped with the R&S SMBV-P101 package. The fast GNSS production tester supports the GPS, Glonass, BeiDou and Galileo satellite systems and includes a wealth of additional test functions for characterizing GNSS chipsets and modules. During production testing of modules and receivers for satellite-based communications, the basic GNSS signal reception and the connection between the antenna and GNSS chipset need to be checked. PXI-based Wireless Test System optimized for Throughput in Production14 August 2015 - National Instruments (NI) released the Wireless Test System (WTS), a solution that is aimed to lower the cost of high-volume wireless manufacturing test. The WTS combines the latest advances in PXI hardware to offer a single platform for multi-standard, multi-DUT and multi-port testing. When used with flexible test sequencing software, such as the TestStand Wireless Test Module, manufacturers can significantly improve instrument utilization when testing multiple devices in parallel. More Articles ...
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