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Readers Top 5 News of last 30 days
News - Board and System TestSMH Technologies introduces first PXI In-System Programmer06 May 2015 - SMH Technologies developed the new universal programmer FRPXIA3. FlashRunner FRPXIA3 based on FlashRunner technology, the extremely fast and reliable programming system for Flash-based microcontroller and serial memories is the first in the world programming solution for PXI system with fully hardware and software ATE integration and Multi-target parallel programming channels. Boundary Scan Analyzer supports Intel Microarchitecture Codenamed Skylake05 May 2015 - Keysight announced its Keysight x1149 boundary scan analyzer will expand its coverage capabilities to test the upcoming Intel microarchitecture codenamed Skylake. The Keysight x1149 analyzer is designed to maximize structural test coverage for board designs that incorporate Intel processors. This additional test application for the Intel microarchitecture codenamed Skylake will help electronics designers and manufacturers use the x1149 to test boards with the new microprocessor architecture using boundary scan and Intel Silicon View Technology (Intel SVT). Probe Family for RF Signal Testing of PCBAs05 May 2015 - Everett Charles Technologies (ECT) launched a new line of high frequency test probes for the PCBA and industrial test markets. The CSP-40 high frequency probe family offers high reliability and excellent electrical performance at competitive pricing and significantly reduces the cost per test insertion. Software optimizes automated testing using Network Analyzers04 May 2015 - The new R&S ZNrun software from Rohde & Schwarz assists users in configuring measurements specifically for multiport DUTs using Rohde & Schwarz vector network analyzers (VNA). The user selects the VNA and any additional test equipment for example an R&S ZNB vector network analyzer and an R&S ZN-Z84 switch matrix and sets the parameters to be measured on the DUT. Based on this information, the R&S ZNrun software takes over communications with the test equipment, makes all of the settings, and executes and controls the test sequence. This procedure simplifies in particular the time-consuming characterization of multiport components. Immunity Test in Frequency Range from 15 Hz to 150 kHz30 April 2015 - Teseq offers a testing system that meets the new requirements for immunity testing to low-frequency disturbances in the frequency range of 15 Hz to 150 kHz. The NSG 4060 complies with current testing standards, including EN 61326-3-1, IEC 61850-3, IEC 60255-22-7, IEC 60533/IEC 60945, IEC 61000-4-16 and IEC 61000-4-19. Vi TECHNOLOGY strengthens support in Germany29 April 2015 - Vi TECHNOLOGY, a provider of inspection solutions for PCB assembly, announced the establishment of Vi TECHNOLOGY GmbH, a wholly-owned subsidiary in Germany. The Vi TECHNOLOGY German Applications and Training Center opened in October 2014 in close proximity to Munich, has already proven to be a strong base to serve the company's German speaking customers. Flexible Test-Handler for In-Circuit and Functional Test29 April 2015 - In-Circuit- or functional test as well as programming processes can be inline automated with IPTE’s new Easy-Test-Handler ETH. The ETH is practical for the use with single-circuit boards, multiple boards or corresponding carriers for circuit boards. Both, one- or double-sided fixtures can be realized. The fixtures can be changed quickly and easily. For optional parallel use of more than one Test-Handler, the Test-Handler can be equipped with a bypass-segment. This allows a constant production process, which is not interrupted by the testing process. Moreover, the Bypass can be used to optimize the cycle time. More Articles ...
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