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Readers Top 5 News of last 30 days
News - Board and System TestProbe Family for RF Signal Testing of PCBAs05 May 2015 - Everett Charles Technologies (ECT) launched a new line of high frequency test probes for the PCBA and industrial test markets. The CSP-40 high frequency probe family offers high reliability and excellent electrical performance at competitive pricing and significantly reduces the cost per test insertion. Software optimizes automated testing using Network Analyzers04 May 2015 - The new R&S ZNrun software from Rohde & Schwarz assists users in configuring measurements specifically for multiport DUTs using Rohde & Schwarz vector network analyzers (VNA). The user selects the VNA and any additional test equipment for example an R&S ZNB vector network analyzer and an R&S ZN-Z84 switch matrix and sets the parameters to be measured on the DUT. Based on this information, the R&S ZNrun software takes over communications with the test equipment, makes all of the settings, and executes and controls the test sequence. This procedure simplifies in particular the time-consuming characterization of multiport components. Immunity Test in Frequency Range from 15 Hz to 150 kHz30 April 2015 - Teseq offers a testing system that meets the new requirements for immunity testing to low-frequency disturbances in the frequency range of 15 Hz to 150 kHz. The NSG 4060 complies with current testing standards, including EN 61326-3-1, IEC 61850-3, IEC 60255-22-7, IEC 60533/IEC 60945, IEC 61000-4-16 and IEC 61000-4-19. Vi TECHNOLOGY strengthens support in Germany29 April 2015 - Vi TECHNOLOGY, a provider of inspection solutions for PCB assembly, announced the establishment of Vi TECHNOLOGY GmbH, a wholly-owned subsidiary in Germany. The Vi TECHNOLOGY German Applications and Training Center opened in October 2014 in close proximity to Munich, has already proven to be a strong base to serve the company's German speaking customers. Flexible Test-Handler for In-Circuit and Functional Test29 April 2015 - In-Circuit- or functional test as well as programming processes can be inline automated with IPTE’s new Easy-Test-Handler ETH. The ETH is practical for the use with single-circuit boards, multiple boards or corresponding carriers for circuit boards. Both, one- or double-sided fixtures can be realized. The fixtures can be changed quickly and easily. For optional parallel use of more than one Test-Handler, the Test-Handler can be equipped with a bypass-segment. This allows a constant production process, which is not interrupted by the testing process. Moreover, the Bypass can be used to optimize the cycle time. Debug and Hardware Validation Tools for Intel Broadwell-DE Microarchitecture24 April 2015 – Engineers designing microserver and other hyperscale workload systems based on the new Intel microarchitecture codenamed Broadwell-DE will be able to quickly debug software and validate high-speed communications interconnects with ASSET InterTech’s SourcePoint and ScanWorks platforms. The first generation of the Intel Xeon Processor D family is based on the microarchitecture previously referred to as Broadwell-DE. Testing non-scannable Partitions with Boundary Scan21 April 2015 - GOEPEL electronics adds a next generation mixed signal I/O module to the JTAG/Boundary Scan hardware platform SCANFLEX. The new SFX-5296LX offers a powerful solution to make even non-scannable partitions testable through boundary scan. This, for example, allows testing of assemblies with just one Boundary Scan IC. The SFX-5296LX is equipped with diverse dynamic test resources for each channel, such as a frequency counter, an event detector, an arbitrary waveform generator and digitizer. More Articles ...
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