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Readers Top 5 News of last 30 days
News - Board and System TestModule for Test of high-speed Interfaces02 March 2015 - GOEPEL electronics introduces a universally adaptable tester which confirms the claims of various high-speed I/O (HSIO) interfaces. The ChipVORX module FXT-X3/HSIO4 allows testing at board level – from the inside, both in the lab and in production. It supports the interfaces GBit Ethernet, PCIe, USB 3.0 and SATA, with transfer rates in the gigabit range. Verification of TDD/FDD LTE Bands for mixed Carrier Aggregation20 February 2015 - Rohde & Schwarz has successfully verified combining various frequency bands in mixed-mode TDD and FDD mixed carrier aggregation. During the test, the R&S CMW500 wideband radio communication tester from Rohde & Schwarz simulated an LTE network with simultaneous time division duplex (TDD) and frequency division duplex (FDD). The data was successfully transferred to the DUT on multiple aggregated carriers in different duplex modes. Automated Final Testing of Mobile Devices19 February 2015 - JOT Automation introduced the JOT G3 an all-in-one final tester for smartphones. It also enables fully automatic tests on wearables like smartwatches in a repeatable and reliable environment. JOT G3 executes multiple tests in a single platform. The solution with a compact footprint is capable of running all the required DUT interface tests on, for example, RF, electrics, mechanics, touch screen, buttons, audio, and plug-in connections. Wireless Test Set supports LTE-A Carrier Aggregation with 3CC, TDD, Uplink Measurements18 February 2015 – Keysight Technologies expanded the capabilities of the E7515A UXM wireless test set. The new features address the rapidly evolving 3GPP LTE-Advanced carrier aggregation advancements. The UXM wireless test set is a highly integrated signaling test set created for functional and RF design validation in the 4G era and beyond. The UXM supports multiple cells, downlink and uplink carrier aggregation, MIMO up to 4x2 and integrated fading – allowing users to assess design readiness with greater confidence. Reliable and Maintenance-Free Fixtures for Board Testing17 Febuary 2015 - Everett Charles Technologies (ECT) introduces a new vacuum actuated test mechanism: the ECT Pneumatic Dual Stage Fixture. This new test fixture ensures predictable and reliable operation in high volume production, cycle after cycle. The new ECT Pneumatic Dual Stage Fixture minimizes down time by eliminating or minimizing jamming, adjustments to the mechanism, and other manual tasks typically encountered during PCBA testing with current industry solutions. BERT for high-speed digital Receiver Characterization12 February 2015 – Keysight Technologies introduced adjustable and integrated intersymbol interference (ISI) capability for the J-BERT M8020A high-performance BERT. When engineers characterize and test high-speed digital receivers for compliance, they often need to emulate a certain channel loss. The new adjustable and programmable ISI function allows engineers to emulate channel loss. This function is integrated in each pattern generator channel of the J-BERT M8020A, which streamlines test setup by eliminating the need for external cabling and the need to switch external ISI traces. Complete eMBMS Test Solution11 February 2015 – Anritsu released a protocol test solution for Enhanced Multicast Broadcast Multimedia Service (eMBMS). The new solution is already helping mobile chipset and device makers accelerate the development of products that can receive LTE broadcast services. EXPWAY’s e-Cast Broadcast Multicast Service Center (BM-SC) Server has been integrated with Anritsu’s MD8430A LTE signaling tester and Rapid Test Designer (RTD) test environment to create a complete test solution. More Articles ...
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