This website uses cookies to implement certain functions. If you use this website you agree to our Privacy Policy.
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.  

Newsletter

Register to our newsletter
Every two weeks -
all news at a glance
captcha 

News about Board and System Test

Integrated Microwave Test System for automated Production Test

25 September 2012— Aeroflex announced the 7700 integrated microwave test system. The 7700 is a complete turnkey ATE (Automated Test Equipment) system-in-a-box designed for rapid production testing of microwave and RF components and modules. The 7700 is a bench-sized instrument that utilizes Aeroflex’s synthetic architecture and Common Platform hardware to achieve fast measurement throughput.

“The 7700 is designed to reduce the cost of production test by eliminating multiple test instruments, ATE development cost, and ongoing maintenance. Over time, configuration, software, and maintenance costs are usually much greater than the initial hardware investment,” said Keith Andrews, product manager for synthetic instruments, Aeroflex.

Compact Measurement Suite is Easily Configured to Test New Devices

The 7700 Integrated Microwave Test System is a complete ATE system within the footprint of a bench instrument. The Aeroflex Measurement Console Test Executive controls all aspects of the production test process, including the DUT (Device Under Test), remote switching hardware, thermal chambers, and more. Using production test sequences provided by the base model, the 7700 provides the functionality and measurements of a vector signal generator, spectrum analyzer, vector network analyzer, oscilloscope, power meter, frequency counter, noise figure meter, and a phase noise analyzer. The 7700’s tight coupling of signal generation, measurements, and DUT control increases measurement throughput significantly over traditional rackmounted ATE systems.

“Customers achieved up to 4X faster throughput using Aeroflex synthetic instruments. We’ve spent many years perfecting our architecture and unique test executive to save customers hundreds of hours writing software and configuring ATE systems,” said Andrews. “The 7700 is quickly configured and redeployed. There’s no need to build a new test system for each new DUT. Customers can test an L-band component in the morning and an S-band module the same afternoon.”

Key specifications

The 7700 Integrated Microwave Test System has a frequency range of 1 MHz to 6 GHz, with options up to 32 GHz. It includes a complete measurement suite including S-parameters for full characterization of devices such as low noise amplifiers (LNA), variable crystal oscillators (VCO), and transceiver modules.

Key specifications of the 7700 include:

  RF modulation bandwidth: 90 MHz

  Frequency switching times: <1 ms

  Phase noise (2 GHz, 20 kHz offset): -115 dBm

  Residual noise floor: <-120 dBm

  Dynamic range: >100 dB

Price and availability

The 7700 Integrated Microwave Test System is available immediately. The instrument comes standard with several built-in tools including measurement, test executive, and reporting tools that accelerate automated test development. Additional measurement personalities are also available from Aeroflex.

www.aeroflex.com


Upcoming Events

What's New in Electronics 2017
Birmingham (UK)
09 to 10 May 2017
PCIM 2017
Nuremberg (Germany)
16 to 18 May 2016
SMT/HYBRID/PACKAGING 2017
Nuremberg (Germany)
16 to 18 May 2016

Social Media

twitter_follow_420x50px