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Seica presents renewed Flying prober and new compact test systems
05 November 2010 - Seica presents on electronica in Hall A1, Booth 459 the renewed Flying probe platform Pilot and the new generation of in-circuit and functional test systems of the Compact Line.
Pilot Flying Probe Test Systems
PILOT is a very versatile and complete line of automated flying probe test systems, offering the widest range of solutions and performances for flying probe test of electronic board
Models range from 4 to 8 test probes, accessing simultaneously one or both sides of the board, positioned in either a horizontal or vertical architecture. The Pilot testers can be equipped with the latest and original measurement techniques, such as Flyscan, Thermal scan, Quick test, Power probes, Parallel Test, all visible in the Pilot V8 test system on display at Seica's booth. Thanks to these innovative capabilities, the Seica systems offer a vast set of solutions, ranging from the traditional in-circuit and functional test, to boundary scan and thermal scan, parallel test for multiple boards together with very low setup times and high fault coverage for any application.
THE COMPACT LINE reaps the benefits of the legacy and success of Seica's preceding lines of in-circuit and functional testers, adding special attention to the needs of today's electronic board production environments.
The entire Compact Line presents a competitive and technologically sophisticated ergonomic solution, which offers maximum flexibility, high test measurement accuracy, high test speed, all in a concentrated space with reduced footprint and extremely low energy consumption, making for a sustainable and innovative product.
Seica will be showing at electronica:
The Compact TK system, dedicated to in-circuit test and equipped with parallel test capabilities to significantly reduce test time, and the Compact DT system, an interesting functional test solution, equipped with analog, digital and boundary scan measurement capabilities, all integrated in a very small enclosure characterized by high portability and readiness for rack-style assembly in more complex systems.
The Compact VL solutions are ideal suited for automotive test needs, thanks to their intrinsic flexibility and deep customization capability, both in hardware and software.www.seica.com
Oscilloscope JTAG Boundary Scan Goepel PXI Rohde & Schwarz Tektronix Keysight AOI Anritsu National Instruments Inspection LTE Aeroflex Teledyne LeCroy Yokogawa In-Circuit-Test Keithley AXI Spectrum Analyzer Signal Analyzer Automotive EMC-Test Advantest Multitest B&K Precision Signal Generator Corelis Flying Prober Cognex SPI Teseq Power Supply GAO Tek Pickering Fluke Teradyne Switching Viscom PCIe
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