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Module for Test of high-speed Interfaces

02 March 2015 - GOEPEL electronics introduces a universally adaptable tester which confirms the claims of various high-speed I/O (HSIO) interfaces. The ChipVORX module FXT-X3/HSIO4 allows testing at board level – from the inside, both in the lab and in production. It supports the interfaces GBit Ethernet, PCIe, USB 3.0 and SATA, with transfer rates in the gigabit range.

The module is serially controlled and can be connected to any Test Access Port (TAP). Heart of the module is an FPGA from Xilinx. Thereby, all for this FPGA existing ChipVORX models can be used. This allows equipping the module with specific test functions for the supported interfaces.

Four slots make the module fully configurable. In addition, even specific interface types can be connected through individual adapter cards. The Boundary Scan software SYSTEM CASCON enables automatic test generation and test execution. As test functions, Bit Error Rate Tests (BERT) and static eye diagram can be performed. This makes the FXT-X3/HSIO4 a flexible external tool for various testing requirements and provides distinct advantages compared to conventional functional tests.

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