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NVMe Analysis Features for Storage Development and Test
04 June 2015 – Teledyne LeCroy released its new PCIe Protocol Suite 7.34 which adds extensive enhancements for PCIe-based storage analysis on the Summit PCI Express Protocol Analyzer product line. Protocol analyzers and exercisers are used by developers and validation engineers to directly record and examine data traffic on serial data communication links between devices and systems. This equipment enables SSD developers to reduce debug and test schedules, lower engineering development costs on new products and meet aggressive time-to-market requirements.
As storage developers make the transition from legacy SAS and SATA protocol-based SSDs to the more advanced NVMe and SATA Express technologies, they are encountering limitations in available design and test tools including limited trace recording times and a lack of standardized analysis reports for PCIe-based storage. These two issues are significant for the newer technologies of NVMe and SATA Express due to the following:
•High performance SSD testing can require recording data traffic beyond a few minutes. This is not possible for many protocol analyzers due to limitations in their recording architectures.
•While some test tool suppliers have claimed support for the NVMe and SATA Express protocols, support for these protocols has remained minimal. This has hampered developer's productivity due to the use of reporting systems designed for the older technologies, which are not optimized for quality testing on NVMe and SATA Express products.
Along with the creation of standardized and detailed analysis reports for NVMe and SATA Express, the newly-released Summit T34 protocol analyzer, specifically targeted at PCIe storage applications, now supports long trace recordings with a new NVMe Enhanced Mode. The Summit T34 can also be configured with up to 64 GB of trace recording memory. NVMe Enhanced Mode builds on and optimizes the existing deep buffer memory to allow users long recording time capability. Depending on the speed of the DUT (Device Under Test), the recording time can be maximized to up to several hours for a single trace capture. This feature is useful for tasks such as measuring performance or determining how well your Queue handling algorithms are functioning. An example of the metrics that are now available include the ability to measure the NVMe queue distribution over a sustained period of time. The ability to gather queue behavior for long periods helps driver and OS developers fine tune their applications and balance queue loads for optimized product performance.
"Teledyne LeCroy is consistently enhancing the features and functionality in our product lines to ensure that developers have the right tools for test," said John Wiedemeier, Product Marketing Manager for PCI Express Protocol Analysis, Teledyne LeCroy. "The NVMe Enhanced Mode provides new capabilities for developers, including easier discovery and identification of intermittent errors and the ability to characterize product performance over long periods of time."
PCIe Protocol Suite 7.34 is available in mid-June.
Oscilloscope JTAG Boundary Scan Goepel PXI Rohde & Schwarz Tektronix Keysight AOI Anritsu National Instruments Inspection LTE Aeroflex Teledyne LeCroy Yokogawa In-Circuit-Test Keithley AXI Spectrum Analyzer Signal Analyzer Automotive EMC-Test Advantest Multitest B&K Precision Signal Generator Corelis Flying Prober Cognex SPI Teseq Power Supply GAO Tek Pickering Fluke Teradyne Switching Viscom PCIe
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