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Automated MIPI M-PHY Transmitter Test Solution

Tektronix MIPI CTS18 November 2015 – Tektronix introduced a fully automated physical layer transmitter test solution for the MIPI M-PHY 3.1 specification and Conformance Test Suite (CTS) 3.1. The solution supports M-PHY High Speed Gears 1, 2 and 3, PWM Mode (G0-G7), and SYS Mode and offers the industry’s lowest noise solution for M-PHY measurements when used with Tektronix DPO70000SX or MSO/DPO70000DX oscilloscopes and P7600 series probes.

The mobile industry is moving toward smaller and faster devices that require faster communication between chips over interfaces such as SSIC and need faster access to storage devices over interfaces such as UFS/MIPI UniProSM. This drives the need for higher data rates, higher throughput, modern design implementations and the need for sophisticated test and measurement tools. Automated serial test solutions such as what Tektronix is now offering for MIPI M-PHY 3.1 allow engineers to complete the full set of tests in significantly less time while improving consistency. The automated solution supports advanced analysis, debugging and characterization of devices while allowing designers to test in compliance mode as well as user-defined mode.

“Last year we introduced comprehensive test support for M-PHY 3.1, giving our customers the tools they needed to design cutting edge mobile devices with higher performance and improved efficiency,” said Brian Reich, general manager, Performance Oscilloscopes, Tektronix. “Now we are taking our test solution to the next level by giving our customers the advantage of full automation which in turn will help them to bring even higher performing products to market in less time.”

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