This website uses cookies to implement certain functions. If you use this website you agree to our Privacy Policy.
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.  

Newsletter

Register to our newsletter
Every two weeks -
all news at a glance
captcha 

News - Board and System Test

Test Adapters for NVMe Dual Port U.2 Drive Testing

TLC PCIe U2Transposer18 May 2016 – Teledyne LeCroy introduced dual port U.2 test fixtures used for isolating NVMe U.2 drives for data storage system testing. The test fixtures (called transposers) are offered as a set of four adapters, each of which provides a unique test configuration for isolating dual port U.2 drives in data storage systems. Interoperability test engineers now have a simple test tool that will help ensure that dual port drives will behave effectively in mission critical systems.

"Working closely with the NVMe storage industry, Teledyne LeCroy will continue to provide test solutions that help drive greater test coverage in storage systems," said John Wiedemeier, Product Marketing Manager in the Protocol Solutions Group, Teledyne LeCroy. "The new transposer adapter set offers enterprise equipment vendors an essential tool for validating NVMe storage systems."

The transposer is inserted between the NVMe U.2 backplane and the U.2 connector on a dual port NVMe drive. Transposers can be interchanged to provide a variety of test configurations, which helps engineers configure specific channels for individual test, allowing performance issues to be quickly identified and isolated to a specific SSD or Host channel.

The set of four transposers features the following configurations:

  • Host Port A to SSD Port A (SSD Port B is masked)
  • Host Port B to SSD Port B (SSD Port A is masked)
  • Host Port A to SSD Port B (SSD Port A is masked)
  • Host Port B to SSD Port A (SSD Port B is masked)

In addition to the ability to isolate and re-route ports, all of the four transposers have the ability to control the DP_EN# (dual port enable) signal through a simple switch on the transposer, and provide a set of electrical test points to allow engineers to directly monitor status and control signals.

Teledyne LeCroy has been supporting the NVMe industry since 2010 with protocol analysis, conformance test tools and specific probing for U.2 -based storage systems and devices. These tools have been a critical test component for much of the PCIe SSD interoperability testing that has occurred over the last few years.

Teledyne LeCroy is a member of the PCI-SIG, the consortium that owns and manages PCI specifications as open industry standards. The organization defines industry standard I/O (input/output) specifications consistent with the needs of its members. Currently, PCI-SIG is comprised of nearly 800 industry-leading member companies.

The PCIe Dual Port U.2 Transposer Set is available to order now.

www.teledynelecroy.com/



Related Articles:

No related articles found


Upcoming Events

productronica 2017
Munich (Germany)
14 to 17 November 2017
Semicon Europa 2017
Munich (Germany)
14 to 17 November 2017
SPS/IPC/DRIVES 2017
Nuremberg (Germany)
28 to 30 November 2017

Social Media

twitter_follow_420x50px