This website uses cookies to implement certain functions. If you use this website you agree to our Privacy Policy.
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.  


Register to our newsletter
Every two weeks -
all news at a glance

News - Board and System Test

Generating automatic Test Programs for Mixed Signal Designs

Goepel TestGenerator08 June 2016 - A new software tool from GÖPEL electronic allows test programs to be automatically generated from analogue/digital designs. The mixed-signal test generator automates test sequences which until now have been generated manually, dramatically reducing the overall conditioning and parametrisation work involved. As a result, project creation is safer, more effective and more flexible.

The first test generator of its kind in the world is integrated in the boundary scan software platform SYSTEM CASCON. It has been specifically optimised to support the new CION-LX chip, a mixed-signal JTAG Tester-on-Chip. The test generator therefore offers a wide range of functions, ranging from frequency measurement and generation or recording of analogue values to dynamic output and digitisation of analogue waveforms.

In principle, any number of identical or different instruments can be activated simultaneously and controlled in interaction with boundary scan test vectors. The test generator has high-performance measurement, analysis, and output functions for conditioning the entire test procedure. These functions guarantee a high level of efficiency when implementing mixed-signal applications. Outputting the test program as CASLAN source code, a special JTAG/boundary scan mixed-signal high-level language, provides a high degree of flexibility. This makes the test fully debuggable and adaptable. The mixed-signal operations can easily be combined with other boundary scan procedures, Flash programming, processor emulation tests or applications of FPGA-embedded instruments.

On the hardware side, the mixed-signal test generator supports both the JTAG/boundary scan platform SCANFLEX and also the new CION-LX modules/FXT96 and FXT192. Test programs can be generated on all SYSTEM CASCON development stations.

Related Articles:

No related articles found

Upcoming Events

Mobile World Congress 2018
Barcelona (Spain)
26 February to 01 March 2018
Embedded World 2018
Nuremberg (Germany)
27 February  to 01 March 2018

Social Media