|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
News about Board and System Test
32 GBaud PAM4 BER Test Solutions
01 February 2017 - Anritsu Corporation announced the release of two upgrades for the Signal Quality Analyzer MP1800A series which strengthen the company’s offering for 32 GBaud PAM4 BER test solutions. The newly developed G0375A 32 Gbaud Power PAM4 Converter and G0376A 32 Gbaud PAM4 Decoder with CTLE support the PAM4 input tests and BER measurements defined in the next-generation 200GbE/400GbE and CEI-56G standards.
In order to address the need for faster communications speeds between servers and network devices, next-generation 200GbE/400GbE Ethernet standard are not only relying on faster symbol rates and multiple lanes, but they are also using PAM (Pulse Amplitude Modulation) as a way to increase the transmission rate. As the next-generation of PAM4 communication standards is developed, a signal integrity test solution with high amplitude 32 Gbaud PAM4 BER generation and high quality and accuracy BER measurement will play a major role.
The Signal Quality Analyzer MP1800A is a plug-in modular Bit Error Rate Tester (BERT) supporting measurement of multi-channel wideband interfaces up to 64 Gbit/s. The newly developed G0375A and G0376A are remote heads for addition to the MP1800A series 32G PPG/ED to extend measurement support for PAM4 measurements using NRZ measuring instruments.
Combining the G0375A with the 28G/32Gbit/s PPG MU183020A converts two 32 Gbit/s NRZ signals to output a high-amplitude PAM4 signal of 4.4 Vp-p (differential, max.). Additionally, the 3ch PPG synchronization function for independent control of the PAM4 signal 3Eye amplitudes enables high-reproducibility evaluation of optical modulators without using an external driver amplifier.
With built-in PAM4 decode and CTLE functions, the G0376A supports measurement of PAM4 decoded binary signals using the 28G/32Gbit/s High Sensitivity ED MU183040B. In addition, combination with the CTLE function supports high-efficiency, input-sensitivity performance tests.
Oscilloscope JTAG Boundary Scan Goepel PXI Rohde & Schwarz Tektronix Keysight AOI Anritsu National Instruments Inspection LTE Aeroflex Teledyne LeCroy Yokogawa In-Circuit-Test Keithley AXI Spectrum Analyzer Signal Analyzer Automotive EMC-Test Advantest Multitest B&K Precision Signal Generator Corelis Flying Prober Cognex SPI Teseq Power Supply GAO Tek Pickering Fluke Teradyne Switching Viscom PCIe
© All about Test 2016