News - Board and System Test

In-System Emulation Technology for Freescale ColdFire Architecture

30 August 2010 - GOEPEL electronic has developed a dedicated model library for the Freescale MCF5225x micro controller with ColdFire V2 architecture to support its innovative emulation technology VarioTAP.

GOEPEL electronic, a vendor of JTAG/Boundary Scan solutions compliant to IEEE Std.1149.x, has developed a dedicated model library for the Freescale MCF5225x micro controller with ColdFire V2 architecture to support the innovative emulation technology VarioTAP.

The libraries, described as VarioTAP models, are structured modularly as intelligent IP and enable a complete fusion of Boundary Scan test and JTAG emulation by employing the BDM debug interface. VarioTAP covers various functions from on-chip Flash programming to emulation test on system level.

“In particular, customers in the field of industrial control have been asking for VarioTAP® support for the MCF5225x series.” Said Stefan Meissner, GOEPEL electronic’s spokesman. “In addition to supporting the architecture, we are continuously extending the provision of test and programming IP’s for Freescale processors.”

Users of the new VarioTAP models are able to combine structural Boundary Scan tests with functional emulation tests for dynamic components as well as high-speed programming on one platform in just one run. The Boundary Scan or BDM signals are controlled by the recently introduced new SCANFLEX hardware TIC020 with programmable Multi Bus interface.

The adaptive streaming technology of the TAP signals allows emulation tests to be executed in parallel or interactively with Boundary Scan tests within a test program, whereby the number of TAPs is unlimited. A multitude of possible configurations including multi processor and “Gang” applications is supported.

The use of VarioTAP does not require expert background knowledge, additional development tools or processor-specific pods, which makes the handling easy and uncomplicated.

Due to the OEM cooperation with all leading vendors of In-Circuit Testers (ICT), Manufacturing Defect Analysers (MDA), Flying Probe Testers (FPT) and Functionality Testers (FT), the new solution is available for production with immediate effect.

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