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Development Environment supports BlackFin and SHARC from Analog Devices

08 May 2014 - The new version of TESSY, a tool for automated unit / module / integration testing of embedded software from Hitex Development Tools, now supports CrossCore Embedded Studio (CCES) from Analog Devices for the processor families BlackFin and SHARC. CCES is a new Eclipse-based integrated development environment, which is supported by TESSY already since CCES V1.0.2.

The support is implemented both in TESSY V3.0.27 and in TESSY V3.1.5. CCES is the successor of the hitherto used development environment from Analog Devices, VisualDSP++, which has been supported by TESSY for a long time.

The adaptation from TESSY to CCES became necessary because former users of VisualDSP++ switched to the modern user interface CCES and because newer derivatives of BlackFin no longer are supported by VisualDSP++. The BlackFin family comprises digital signal processors for computationally intensive applications like audio and video processing. Also the SHARC family with its 32 bit floating point processors targets computationally intensive real-time processing applications.

Due to the support of CCES, TESSY is now able to execute automated tests in the software simulation environment provided by CCES or the tests can be executed via CCES on the actual BlackFin or SHARC hardware. TESSY uses the tools included in CCES to compile and link the test application generated by TESSY. Then TESSY loads the test application automatically in CCES and controls the test execution.

TESSY provides all its usual functionality for the microcontrollers from Analog Devices. This comprises for instance measurement of the code coverage, software integration testing, automatic test report generation or the traceability of requirements to test cases. For test case specification TESSY includes the Classification Tree Editor CTE/ES. A powerful command language allows for automated regression testing and continuous integration. Furthermore, TESSY is able to create a special test application with built-in test data, which the user then can load interactively (using the debugger in CCES) into the microcontroller in question, either on the actual hardware or in a software simulation of the microcontroller. This allows easy investigation of the reason of a failed test case.

For the test of safety-critical applications it is advantageous that TESSY is already qualified to be used in safety-related software development according to IEC 61508 and ISO 26262.

www.hitex.com/

 



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