|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
News - Board and System TestAutomated System Test of Android Devices05 March 2015 - JOT Automation, a supplier of test and production solutions, and Profilence, the novel test software provider, introduce an automated test solution for operators enabling a full system test coverage of all types of Android devices. JOT G3 with Profilence Tau speeds up the time-to-market and cuts total costs by testing the entire device in a reliable and repeatable environment. JOT G3 with Tau inspects in every detail the operating system and all physical interfaces with real-life use-cases. It is easily adaptable from one device type to another form-factor and one test range to the next one on line. The system is designed for test runs lasting over one hundred hours and heavy reuse of test cases on different devices, making it an ideal operator choice. “Hundreds of millions Android phones are sold and close to one thousand device variants introduced every year. Operators need to run vast amounts of test cases in very narrow timespans. Our extensive solution is appealing as manual testing is so costly and time-consuming,” said Mika Mämmelä, Business Line Director at JOT Automation. “The system goes beyond the simple pass/fail information. Our solution provides a deep analysis of every single test case, helping to find the root cause faster. It automatically stores all results, logs, video streams, crash dumps and profiling data to a cloud, securing easy data accessibility for every team member,” emphasizes Mikko Keskitalo, CEO at Profilence. “Furthermore, the solution has an excellent capability to mimic real-world behaviour by allowing interruptions during testing. For example, it can respond to a text message simultaneously with full speed testing without issues.” Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |