News - Board and System Test

MIPI M-PHY v3.0 Interface S-Parameter and Impedance Testing

29 July 2014 – Agilent announced the availability of its Method of Implementation (MOI) document for the transmitter/receiver (Tx/Rx) interface S-parameter and impedance tests defined in version 3.0 of the MIPI Alliance Specification for M-PHY. The MOI, and a test package such as a state file, which makes setup and measurement easy, works with the ENA Series network analyzer’s enhanced time domain analysis option (E5071C-TDR).

Mobile devices require a physical layer (PHY) capable of handling high-speed data signals with low-power consumption through their interfaces. MIPI M-PHY is a high-frequency, low-power PHY standard for protocols like DigRF v4, UniPro, LLI, CSI and UFS, which are used to connect devices such as displays, cameras, memory, or storage devices within mobile devices. To ensure these interfaces comply with the MIPI M-PHY specification, they must be tested under actual operating conditions and in accordance with the M-PHY Specification version 3.0.

Agilent’s MOI eases this process by providing engineers with a measurement guide of procedures for the interface S-parameter and impedance tests defined in the latest MIPI M-PHY specification. Using the MIPI M-PHY v3.0 MOI and state files, semiconductor and product integrator manufacturers are able to more efficiently perform compliance tests to the standard with the E5071C-TDR.

“Agilent offers MOIs for many high-speed digital applications, such as HDMI, USB, PCI Express, SD Card and 10GBASE-KR/40GBASE-KR4 Ethernet.” said Akira Nukiyama, vice president and general manager, Agilent’s Component Test Division. “Our recent addition of an MOI for version 3.0 of the MIPI M-PHY standard is yet another example of how we are working to ensure our customers have the capabilities they need to address any high-speed measurement challenge.”

The MIPI M-PHY v3.0 MOI for use with the E5071C-TDR is available now.

www.agilent.com/

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