This website uses cookies to implement certain functions. If you use this website you agree to our Privacy Policy.
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.  

Newsletter

Register to our newsletter
Every two weeks -
all news at a glance
captcha 

News - Board and System Test

Telecom 10/700 μs Pulse Module

18 July 2011 - Teseq has developed a 10/700 μs telecom module to fit either into an NSG 3060 test system or into an expansion housing which can be controlled via touch panel of the NSG main unit. The new pulse generator modules can be combined with standard test modules like EFT and combination wave to suit user’s application.

The 10/700 μs telecom wave generator is used to test ports intended for connection to symmetrical communication lines.

The Telecom Surge Module TSM 3751 generates test pulse of 10/700 μs as described in IEC/EN 61000-4-5:2005 and IEC 60060-1, ITU–K series, ANSI/IEEE C62.41 and several EN standards and the safety standard of UL 1950. Because tolerances can be taken into account, it will also cover the 9/720 μs pulse given in ANSI-TIA-968-B.

Therefore, the pulse will fulfil the new IEC recommendation of open circuit voltage of 10/700 μs and the short circuit current pulse measuring of 5/320 μs. The test voltage satisfies the basic requirement of IEC up to 4 kV and surpasses the UL1950 safety test recommendation of 7 kV.

For convenience and fast test setup, the impedance is selectable just by a tap on the touch screen, depending on test setting from either 15 or 40 Ω. The fast minimum repetition time of 20 sec. gives three times more test margin compared to the given IEC recommendation.

www.teseq.com


Related Articles:

No related articles found


Upcoming Events

productronica 2017
Munich (Germany)
14 to 17 November 2017
Semicon Europa 2017
Munich (Germany)
14 to 17 November 2017
SPS/IPC/DRIVES 2017
Nuremberg (Germany)
28 to 30 November 2017

Social Media

twitter_follow_420x50px