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News about Board and System Test
SPEA: Latest in Flying Probe and Bed-of-Nails Test Technology
08 November 2011 - At booth A1.255, SPEA will exhibit its new generation of flying probe testers: Three new models, based on an innovative architecture to provide substantial advantages in terms of cost of test, ease of use, productivity and test coverage.
New-generation flying probers
The key points of SPEA flying probers’ new test architecture are: a drastic test time reduction; the integration of advanced smart functions that lower the skill level required; enhanced diagnostic capabilities, attained through advances in electronics, mechanics, system instrumentation control.
The all-new measurement electronics allows ultra-precise measurements, thanks to the resolution and accuracy of the instrumentation, while reducing measurement acquisition time to a few microseconds.
Measurement accuracy is then supported by the extreme mechanical accuracy, that enables the flying probes to directly contact the smallest pins of 01005, 0201, RQFP packages. This level of mechanical accuracy is attained by using linear optical encoders, placed directly on the X, Y, Z axis, which allow the real-time dynamic measurement of the flying probes position. With 0.012 µm resolution, these guarantee a probing accuracy and stability much higher than those of systems based on rotating encoders or planar motors.
The innovative multi-process platform manages the concurrent execution of multiple test techniques, optimizing the test program, that combines in-circuit test (powered-up or not), nodal impedance test (for fast detection of shorts and hidden faults), optical inspection, boundary scan test, functional test.
All of these functions are complemented by a simple yet powerful software environment. The Leonardo operating system offers guided test program development with fast generation tools, and automated functions to debug and refine the program. The new AutoDebug and AutoTuning functions provide the test systems with the expertise required to verify the efficiency of the test program generation and the real measurement on the board. The sequence of operations typically performed by a skilled technician are automated in algorithms that perform all the verifications and corrections required, without the intervention of an engineer.
Additionally, Leonardo’s environment provides efficient tools for more advanced functions such as: Automatic Test Program Generation without CAD files and board information; complete advanced control of the system instrumentation; specific test coverage settings; test programs for printed circuits, mother boards, board repair.
Three models for the widest range of requirements
The new SPEA flying probe family includes three different models, designed for a wide variety of production requirements.
The flagship system is the brand-new 4060, the multi-purpose tester that offers the best performance level and instrumentation expandability. The 4060 provides the widest test area, dual-side probing capabilities, the possibility to perform power functional tests and boundary scan.
The 4060 can be flexibly used loading the boards manually, automating the board loading/unloading from racks, or integrating the system in-line, with no configuration changes.
The 4030’s concept is high productivity: The 4030 is the only flying prober designed for end-of-line testing of high-volume productions. When the accessibility limits, or the frequent product layout changes, make it difficult to perform in-circuit test with traditional bed-of-nails systems, the 4030 can be the solution for production test, with comparable throughput.
Completing the line-up, the 4020 offers the same performance quality of the larger systems, but with an entry-level price. Particularly suitable for prototype and small series test, the 4020 is a very easy-to-use tester with a compact footprint.
Multi-Core architecture multiplies the productivity of in-circuit testers
SPEA 3030 in-circuit test architecture is based on the concepts of multi-core system and multiple test engines, to increase the tester productivity and performance.
Each 3030 system can host from 1 to 4 cores, each one equipped to perform the required tests on the boards: in-circuit, on-board programming, open pin test, optical test, boundary scan, dynamic digital. In this way, a single machine provides the performance of multiple testers, with a system configuration that can change at any time, adapting and/or expanding to match the evolution of the test requirements.
The system cores work in parallel, and totally independently, since each core is equipped with a powerful dedicated control unit, and local memory. Thanks to this distributed intelligence, parallel testing of multiple boards is executed truly simultaneously, since it is independent from the system controller.
The system productivity is immediately multiplied by four: the simultaneous test of four boards is performed in the same time required by one board.
At Productronica, two models of 3030 will be present. The 3030 In-Line integrates the automation for board transportation, and is designed to provide a straightforward integration in the production line. The 3030 Compact is a highly ergonomical tester with a compact footprint.www.spea.com
Oscilloscope JTAG Boundary Scan Goepel PXI Rohde & Schwarz Tektronix Keysight AOI Anritsu National Instruments Inspection LTE Aeroflex Teledyne LeCroy Yokogawa In-Circuit-Test Keithley AXI Spectrum Analyzer Signal Analyzer Automotive EMC-Test Advantest Multitest B&K Precision Signal Generator Corelis Flying Prober Cognex SPI Teseq Power Supply GAO Tek Pickering Fluke Teradyne Switching Viscom PCIe
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