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Readers Top 5 News of last 30 days
News - Component TestHighly Parallel Testing of Next-Generation Universal Flash Storage and PCIe BGA SSDs21 January 2019 – Advantest unveiled its new T5851 STM16G memory tester for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market. Probe-2-Pad Inspection Station16 January 2019 - aps Solutions developed a tool, that allows the user precisely to check the position of probe tips of a Probe Card versus the probe pads of a Semiconductor wafer. The tool allows to check the behavior of the probe tips under real touch-down conditions as well as investigation of probe tips or needle beams under a microscope. Advantest acquires Semiconductor System Level Test Business from Astronics Corporation10 January 2019 – Advantest Corporation entered into a definitive agreement under which Advantest will acquire the commercial Semiconductor System Level Test business (“Test Systems”), a provider of system level test for semiconductor components and modules, from Astronics Corporation for $185 million, plus an earn-out payment of up to $30 million based on certain performance milestones. Fast Production Test of UV-LEDs17 December 2018 – Within its well-established CAS-series of spectroradiometers, Instrument Systems has developed a novel series-type CAS 140D-157. This new system measures precisely and reliably not only within the visible spectrum, but also in the UV. Coupled with a PTFE-coated integrating sphere, the system permits for fast 24/7 production tests of UV emitters to be run. Parametric Testing for Developing and Manufacturing Next-Generation ICs13 December 2018 – Advantest introduced its new V93000 SMU8 parametric tester to meet chip makers’ process-characterization and monitoring needs for the exacting measurements required on the 28 nm to 3 nm process nodes and beyond. With per-pin source measurement units (SMU) for next-generation DC parametric testing, the system allows users to quickly measure and verify electrical and timing characteristics at any device pin, thereby enabling more cost-efficient manufacturing and faster time to market for new IC designs. Test of High-Voltage Semiconductors04 December 2018 – Advantest Corporation launched a new module for its EVA100 measurement system that enables testing of high-power ICs used in large-volume consumer applications. With the new HVI (high-voltage VI source and measurement) module, chip makers can ensure the reliability of power devices in widely used applications such as AC/DC and DC/DC converters, motor controllers, LED drivers and gate drivers by accurately measuring their current leakage and breakdown voltages. Pattern Conversion Software for Cloud-Based Semiconductor Testing27 November 2018 – Test Systems Strategies, Inc. (TSSI), a supplier of design-to-test pattern conversion, simulation and validation tools, and Advantest CloudTesting ServiceTM (CTS), developer of the semiconductor industry’s first on-demand testing service, announced a new software module to convert electronic design automation (EDA) formats (e.g., VCD, EVCD, WGL, STIL) to the Advantest CTS CX1000 platform. More Articles ...
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