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Readers Top 5 News of last 30 days
News - Component TestTesting Battery Voltage, Resistance, Capacitance, Reactance and more16 January 2018 - B&K Precision announced two new battery analyzers, models BA6010 and BA6011. Both battery analyzers measure voltage and resistance of modern battery technologies with high accuracy, resolution, and speed. Additionally, these instruments provide auxiliary measurement parameters inductance, capacitance, dissipation factor, impedance, quality factor, reactance, and phase angle in degrees and radians. Test of High-Power Analog ICs used in Electric Vehicles21 December 2017 – Advantest introduced two new modules that enable its T2000 IPS system to test high-voltage and high-power devices used in the power trains of electric vehicles (EV/HV). The new enhanced MMXHE (multifunction mixed high voltage) and MFHPE (multifunction floating high power) modules enable massively parallel, high-performance testing by leveraging Advantest’s innovative multifunctional pin design, which allows unprecedented flexibility in assigning test resources to any pin. Efficient Testing of Semiconductor Devices21 November 2017 – Advantest presented the new EVA100 Digital Solution at the Productronica trade show in Munich, Germany, on 14-17 November. The latest member of the EVA100 measurement system’s family tests a broad variety of digital ICs. Available for engineering and production use, the system is capable of design evaluation, wafer sort, package test, DFT test, package validation, IP validation, failure analysis and system level test. Non-contact Probing of Wafers09 November 2017 - TeraProbes, Inc. and bsw TestSystems & Consulting announced that they have formed a Solution Partnership to bring the innovative non-contact probing technology to researchers and practitioners in 6 countries in the European Union, including Germany, Switzerland, Austria, Belgium, The Netherlands, and Luxemburg. Under the partnership, bsw TestSystems & Consulting will provide the sales and service support for TeraProbes, Inc.’s non-contact probe station line and will be the first point of contact in these 6 countries. High-Throughput 1 ns Pulsed IV Memory Test Solution11 October 2017 – Keysight Technologies announced a solution to characterize magnetic tunnel junction (MTJ) for spin transfer torque magnetoresistive random access memory (STT-MRAM) to overcome challenges of conventional rack and stack base test environments. Keysight’s new NX5730A High-Throughput 1 ns Pulsed IV Memory test solution is a dedicated solution for researchers and engineers struggling with the characterization of MTJ devices on silicon wafers. aps Solutions is authorized Distributor of STAr Technologies Probe Cards in Europe26 September 2017 - STAr Technologies, a manufacturer of Semiconductor test systems and probe cards based in Taiwan, named aps Solutions GmbH as authorized distributor for probe cards in Europe and Israel. STAr Technologies delivers cost-effective, high-density vertical probe cards with either buckling beam ("Cobra"), spring- or wire probes. Advantest opens Call for Papers for VOICE 2018 Developer Conference22 September 2017 – Advantest Corporation issued an international call for papers for the VOICE 2018 Developer Conference focusing on innovative test solutions for system-on-chip (SoC) and memory semiconductor devices, handler solutions, best practices and hot topics. The 2018 conference will return to the 2016 host cities of San Diego, CA and Hsinchu, Taiwan on May 15-16 and on May 23, respectively, under the unifying theme “Measure the Connected World…and Everything in It℠.” More Articles ...
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