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Readers Top 5 News of last 30 days
News - Component TestRF Contactor compensates for HIB Tolerances13 September 2017 - Multitest’s Link HB contactor exhibited excellent RF performance at customer sites ensuring ultra-clean high speed signals. The patent-pending design adds boardside compliance to compensate for board fabrication tolerances ensuring increased contact reliability and multisite stability. Massively Parallel Test Fixture for Testing of Display Driver ICs05 September 2017 - Advantest introduced the RND440 Type 3 fixture, an optional enhancement on its T6391 display driver IC (DDI) tester that makes the system capable of massively parallel testing of chip-on-film (CoF) packages for the latest generation of smart phone screens. The unit is designed to handle the growing number of pins on DDIs, the increasing speeds of interfaces and the highly integrated functions that enable high-resolution displays. Interview: Innovating Impedance MeasurementZurich Instruments is a test and measurement company based in Zurich, Switzerland, which develops and produces lock-in amplifiers, phase-locked loops, impedance analyzers, arbitrary waveform generators and boxcar averagers. We talked to Dr Tim Ashworth, Applications Manager at Zurich Instruments, about the latest innovations in impedance analysis and the Mid-Frequency Impedance Analyzer and Precision LCR (MFIA) Meter launched last year. Compact Vector Network Analyzer for S-Parameter Measurements29 August 2017 -- Rohde & Schwarz launched the R&S ZNLE vector network analyzer to address the requirements of customers looking to perform RF measurements to characterize components such as antennas, attenuators, filters and PCBs. The new standalone instrument weighs only 6 kg and has a footprint of just 408 mm x 235 mm, saving up to two thirds of space on the workbench compared with competitive VNAs. Solid-State-Drive Test Solution covers also BIST25 August 2017 - Advantest has expanded its SSD test coverage with new offerings in the MPT3000 series. With hundreds of systems already installed, the product line is now extended to cover more test insertions including engineering, low-volume production, and built-in self-test (BIST) applications, all with the same MPT3000 architecture and software. The MPT3000 modular, tester-per-DUT (device under test) architecture and unique hardware acceleration, now supports all SSD protocols and form factors. Contactor for WLCSP Testing in Customer Evaluation22 August 2017 - Multitest’s new 0.3 mm pitch Atlas contactor successfully passed a demanding customer production floor evaluation. The customer’s evaluation measures confirmed that the Atlas did reduce the customer’s cost of test while improving test yield and increasing throughput. Based on the evaluation results, the customer ordered a significant number of Atlas 030 contactors to support their new product WLCSP production ramp. VNAs to Support High Data Rate Requirements of 5G and Data Center Cloud Systems17 August 2017 – Anritsu Corporation introduced the Universal Fixture Extraction (UFX) option for its VectorStar vector network analyzers (VNAs) to provide signal integrity and on-wafer engineers with an increased range of on-wafer and fixture calibration choices, even when a full set of calibration standards is not available. Developed to address the design challenges associated with the high-frequency, high data rate requirements of 4G and emerging 5G systems, as well as backhaul and data centers, UFX features unique analysis tools so engineers can more accurately and efficiently evaluate designs. More Articles ...
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