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Readers Top 5 News of last 30 days
News - Component TestReview and Classification of Ultra-Small Photomask Defects20 December 2022 – Advantest unveiled the E5620 Defect Review Scanning Electron Microscope (DR-SEM), its newest mask SEM product for reviewing and classifying ultra-small defects on photomasks and mask blanks. With its high-accuracy, high-throughput defect review capability, the E5620 DR-SEM is expected to contribute appreciably to production quality improvements in next-generation photomasks and shorter mask manufacturing turnaround times. Tektronix partners with BRIDG to expand Semiconductor Package Testing14 December 2022 - Tektronix announced an official collaboration with BRIDG, a not-for-profit, public-private partnership specializing in advanced system integration and integrated circuit packaging. This collaboration will expand advanced semiconductor package testing capabilities in the US. Tektronix Component Solutions offers domestic wafer test and package assembly and test services across a wide range of technologies. High-Performance Test Cells for advanced Memory ICs09 December 2022 – Advantest launched inteXcell, a new line of minimal-footprint test cells designed to address demanding final-test requirements presented by the increasing bit densities, lower power consumption and faster interface speeds of future memory devices. This new final test cell infrastructure integrates a T5835 memory tester optimized for use in high-productivity test cells and is designed to adopt future memory solutions. With inteXcell, ICs can be tested on the same platform from initial engineering through mass production. Software Solution accelerates Yield Improvement in IC Engineering and Production30 November 2022 – Advantest is offering a new yield-improvement solution that leverages artificial intelligence (AI) to expedite identifying the root causes of yield loss and increasing the efficiency of analyzing test results. The innovative and scalable Advantest Cloud Solutions Engineering AI Studio for Yield Improvement (ACS EASY) can increase the productivity of both device engineering and production operations for a wide range of users, from chip designers to outsourced semiconductor assembly and test (OSAT) companies. Battery Insulation Tester17 November 2022 - HIOKI E.E. Corporation released the Battery insulation tester BT5525 for use in production lines for LIB (lithium-ion battery) battery cells. It is a device to detect insulation defects that cause battery ignition or reduce longevity. Until now, it has been difficult to detect latent defects in battery cells, such as the presence of metallic foreign matter or small short circuits. The BT5525 solves these problems by introducing new functions and improving measurement performance. Power IC Test Platform16 November 2022 - Chroma ATE launched the next generation of its high-performance power IC test platform. The new Chroma 3650-S2 provides excellent power measurement features and up to 768 digital I/O and analog pins with a maximum power supply capacity of 3000V or 160A per channel. Test of Power Management ICs and High-voltage Devices26 October 2022 – Advantest launched the latest addition to its Extended Power Supply (XPS) card series: the DC Scale XPS128+HV. This universal voltage-current (VI) instrument combines a high channel count (128 channels per card) with per-channel voltage ranges of up to +24V creating a test solution that efficiently addresses the test requirements for high-voltage devices such as USB Power Delivery components and charger functionalities in power management ICs (PMICs). More Articles ...
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